cMOF Evidence Base
Spectroscopy — Tunable Carrier Type of a Semiconducting 2D Metal-Organic Framework Cu3(HHTP)2

Measurement evidence

Spectroscopy

Tunable Carrier Type of a Semiconducting 2D Metal-Organic Framework Cu3(HHTP)2 · De Lourdes Gonzalez-Juarez M., Morales C., Flege J.I. et al. · ACS Applied Materials and Interfaces · 2022 · 12404-12411

2 measurement groups · 19 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu 2p3/2 XPS fitting for Cu(II)/Cu(I) ratios

X-ray photoelectron spectroscopy

CuHHTP-40 PMMA-transferred Cu3(HHTP)2 film · Thin Film

Two subsequent sets of 50 scans; total exposure time of 90 min in each set.

Atmosphere
ex-situ XPS
Context
PMMA-transferred composite films.
Measurement source
main p.6, article p.12409 · Charge Transport Properties · Figure 5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CuHHTP-40 Cu(II)/Cu(I) ratio, round 197.7/2.3——Text
Exact Reported		main p.6, article p.12409 · Charge Transport Properties · Figure 5
CuHHTP-40 Cu(II)/Cu(I) ratio, round 291.4/8.6——Text
Exact Reported		main p.6, article p.12409 · Charge Transport Properties · Figure 5
CuHHTP-70 Cu(II)/Cu(I) ratio, round 169.9/30.1——Text
Exact Reported		main p.6, article p.12409 · Charge Transport Properties · Figure 5
CuHHTP-70 Cu(II)/Cu(I) ratio, round 232.6/67.4——Text
Exact Reported		main p.6, article p.12409 · Charge Transport Properties · Figure 5
CuHHTP-40 average Cu(II)/Cu(I) ratio93.9/6.1——Caption
Exact Reported		main p.5, article p.12408 · Figure 5 · Figure 5
CuHHTP-70 average Cu(II)/Cu(I) ratio48.1/51.9——Caption
Exact Reported		main p.5, article p.12408 · Figure 5 · Figure 5
Total XPS exposure time per set90 min in each set——Text
Exact Reported		main p.6, article p.12409 · Charge Transport Properties · Figure 5

Ex-situ XPS survey spectra, Omnicron EA 125, pass energy 20 eV, Shirley background

X-ray photoelectron spectroscopy

CuHHTP-40 PMMA-transferred Cu3(HHTP)2 film · Thin Film

Transferred MOF films supported on Si substrates with native oxide using UHV-compatible carbon tape; no heating or Ar+ sputtering.

Atmosphere
ex-situ XPS; no surface cleaning
Context
PMMA-transferred composite films.
Measurement source
SI p.S2 · Characterisation methods · Figure S4; Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Relative O/Cu ratio CuHHTP-70 vs CuHHTP-404 times higher in CuHHTP-70 than CuHHTP-40——Text
Rounded Reported		main p.6, article p.12409 · Charge Transport Properties · Table S1
CuHHTP-40 C atomic concentration72.9%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
CuHHTP-40 Cu atomic concentration2.9%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
CuHHTP-40 N atomic concentration2.6%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
CuHHTP-40 O atomic concentration21.6%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
CuHHTP-70 C atomic concentration74.9%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
CuHHTP-70 Cu atomic concentration0.7%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
CuHHTP-70 N atomic concentration2.9%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
CuHHTP-70 O atomic concentration21.5%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
Theoretical C atomic concentration70.6%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
Theoretical Cu atomic concentration5.9%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1
Theoretical O atomic concentration23.5%——SI Table
Exact Reported		SI p.S6 · Table S1 · Table S1