Microscopy Morphology — Tunable Carrier Type of a Semiconducting 2D Metal-Organic Framework Cu3(HHTP)2

Measurement evidence

Microscopy Morphology

Tunable Carrier Type of a Semiconducting 2D Metal-Organic Framework Cu3(HHTP)2 · De Lourdes Gonzalez-Juarez M., Morales C., Flege J.I. et al. · ACS Applied Materials and Interfaces · 2022 · 12404-12411

4 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Energy-dispersive X-ray spectroscopy (EDS)

As-electrodeposited Cu3(HHTP)2 thin film on Au/SiO2 · Thin Film

Elemental analysis of electrodeposited Cu3(HHTP)2 film.

Context
Pristine electrodeposited film.
Measurement source
main p.3, article p.12406 · Results and Discussion · Figure S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EDS detected elements in electrodeposited filmCu, O and C detected; atomic ratio in good agreement with Cu3C36H18O12Text
Qualitative
main p.3, article p.12406 · Results and Discussion · Figure S2

SEM, JEOL JSM-6500F

As-electrodeposited Cu3(HHTP)2 thin film on Au/SiO2 · Thin Film

Top-view and cross-sectional SEM of as-electrodeposited Cu3(HHTP)2.

Context
Pristine electrodeposited film.
Measurement source
main p.3, article p.12406 · Results and Discussion · Figure 3; Figure S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Electrodeposited film thicknessca. 5 umText
Approximate
main p.3, article p.12406 · Results and Discussion · Figure S1
Aggregated nanorod average width86 nmText
Rounded Reported
main p.3, article p.12406 · Results and Discussion · Figure 3b
As-electrodeposited spherical particle diameterca. 6 umText
Approximate
main p.3, article p.12406 · Results and Discussion · Figure 3a

Photographs, SEM cross-section and EDS analysis for PAA-transferred film

CuHHTP-PAA-40 PAA-transferred Cu3(HHTP)2 film · Thin Film

PAA-transferred Cu3(HHTP)2 film visual and cross-sectional characterisation.

Context
PAA-supported composite film.
Measurement source
SI p.S7 · Figure S5 caption · Figure S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PAA-transferred film EDS carbon atomic percentage71.76%Visual Estimate
Approximate
SI p.S7 · Figure S5 · Figure S5b
PAA-transferred film EDS copper atomic percentage4.93%Visual Estimate
Approximate
SI p.S7 · Figure S5 · Figure S5b
PAA-transferred film EDS oxygen atomic percentage23.32%Visual Estimate
Approximate
SI p.S7 · Figure S5 · Figure S5b

SEM of PMMA-transferred films

CuHHTP-70 PMMA-transferred Cu3(HHTP)2 film · Thin Film

SEM images of PMMA-transferred Cu3(HHTP)2 films dried at 40 C and 70 C.

Context
PMMA-supported composite films.
Measurement source
main p.4, article p.12407 · Results and Discussion · Figure 3c,d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CuHHTP-40 surface morphologyFlattened compact surface with clear interparticle connectivityText
Qualitative
main p.3, article p.12406 · Results and Discussion · Figure 3c
CuHHTP-70 surface morphologyRougher and more disrupted surface; brighter zones attributed to PMMA charging/residuesText
Qualitative
main p.5, article p.12408 · Charge Transport Properties · Figure 3d