Energy-dispersive X-ray spectroscopy (EDS)
As-electrodeposited Cu3(HHTP)2 thin film on Au/SiO2 · Thin Film
Elemental analysis of electrodeposited Cu3(HHTP)2 film.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDS detected elements in electrodeposited film | Cu, O and C detected; atomic ratio in good agreement with Cu3C36H18O12 | — | — | Text Qualitative | main p.3, article p.12406 · Results and Discussion · Figure S2 |