cMOF Evidence Base
Diffraction Structure — Tunable Carrier Type of a Semiconducting 2D Metal-Organic Framework Cu3(HHTP)2

Measurement evidence

Diffraction Structure

Tunable Carrier Type of a Semiconducting 2D Metal-Organic Framework Cu3(HHTP)2 · De Lourdes Gonzalez-Juarez M., Morales C., Flege J.I. et al. · ACS Applied Materials and Interfaces · 2022 · 12404-12411

3 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Grazing incidence X-ray diffraction (GIXRD), Rigaku Smartlab, Cu K alpha, lambda = 1.5406 A

X-ray diffraction and scattering

As-electrodeposited Cu3(HHTP)2 thin film on Au/SiO2 · Thin Film

Pristine electrodeposited Cu3(HHTP)2 on SiO2; phase compared with bulk Cu3(HHTP)2.

Context
Pristine control before polymer transfer.
Measurement source
main p.3, article p.12406 · Results and Discussion · Figure 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
GIXRD (002) peak position27.86 degrees 2theta——Text
Exact Reported		main p.3, article p.12406 · Results and Discussion · Figure 2
GIXRD (100) peak position4.79 degrees 2theta——Text
Exact Reported		main p.3, article p.12406 · Results and Discussion · Figure 2
GIXRD (200) peak position9.56 degrees 2theta——Text
Exact Reported		main p.3, article p.12406 · Results and Discussion · Figure 2
GIXRD (210) peak position12.59 degrees 2theta——Text
Exact Reported		main p.3, article p.12406 · Results and Discussion · Figure 2

GIXRD before and after PMMA transfer

X-ray diffraction and scattering

CuHHTP-40 PMMA-transferred Cu3(HHTP)2 film · Thin Film

Transferred Cu3(HHTP)2 films dried at 40 C and 70 C compared against neat PMMA and pristine film.

Context
PMMA-supported composite films.
Measurement source
main p.3, article p.12406 · Results and Discussion · Figure 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
MOF phase retained after PMMA transferWell-defined diffraction peaks corresponding to the MOF phase remain in transferred films——Text
Qualitative		main p.3, article p.12406 · Results and Discussion · Figure 2

Framework structure description and packing model

As-electrodeposited Cu3(HHTP)2 thin film on Au/SiO2 · Thin Film

Connectivity and packing of Cu3(HHTP)2 framework shown schematically.

Context
Pristine framework structural description.
Measurement source
main p.2, article p.12405 · Introduction · Figure 1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Interlayer spacing between AA packed sheets3.3 A——Text
Rounded Reported		main p.2, article p.12405 · Introduction · Figure 1
Pore sizeca. 18 A——Text
Approximate		main p.2, article p.12405 · Introduction · Figure 1