Ohata T., Nomoto A., Watanabe T. et al. · ACS Applied Materials and Interfaces · 2021 · 54570-54578
Open a family to keep every result attached to its sample, method and conditions.
Paraphrased for this database from the authors’ stated interpretations — never quoted verbatim — and kept separate from reported measurements.
The much smaller observed molecular area than the monolayer estimate indicates multilayer HITP-Ni-NS formation at the air/liquid interface.
54573 / p004 · Creation of Nanosheets Confirmed by In Situ Observation · Figure 2 · Linked to 3 structured results
Nickel coordination is required for the crystalline conductive MOF nanosheet; HATP-water-NS lacks crystalline XRD peaks and has different morphology/electronic spectra.
Caveat: HATP-water-NS is a control nanosheet rather than a conductive MOF.
54575-54576 / p006-p007 · Nanosheet Structure and Orientation Confirmed by Synchrotron X-ray Crystallography · Figures S12, S13, S19 · Linked to 5 structured results
HITP-Ni-NS is highly crystalline in-plane and ordered out-of-plane with non-overlapping in-plane and out-of-plane Bragg reflections, indicating preferential uniaxial orientation.
Caveat: Stacking model is narrowed to eclipsed/slipped AA or slipped AB consistency rather than uniquely resolved.
54575 / p006 · Nanosheet Structure and Orientation Confirmed by Synchrotron X-ray Crystallography · Figure 5 · Linked to 5 structured results
Five-cycle HITP-Ni-NS films show Ohmic planar conduction with 0.6 S cm-1 conductivity at room temperature.
Caveat: Best value is for a top-contact film device, not an intrinsic single-domain in-plane conductivity.
54576 / p007 · Electrical Conductivity · Figure 6 · Linked to 3 structured results
Spreading HATP onto aqueous Ni(OAc)2.4H2O at the air/liquid interface immediately forms crystalline HITP-Ni-NS; surface compression mainly reorganises/gathers nanosheets.
Caveat: The zero-compression route is reported with fewer recipe details than the main compressed route.
54573-54575 / p004-p006 · Results and Discussion · Figures S3, S18 · Linked to 3 structured results
HITP-Ni-NS FET output curves are linear with negligible gate modulation, consistent with conductive rather than semiconductive behaviour.
Caveat: The text reports an unusual ID on/off ratio value of 10^-6; preserved verbatim.
54576 / p007 · Electrical Conductivity · Figure S24 · Linked to 3 structured results
Higher deposition-cycle films conduct much better than two-cycle films, supporting an important role for interlayer pi-pi conduction paths in bridging voids.
Caveat: The hopping-barrier numbers come from cited modelling summarised in a schematic, not new calculations in this paper.
54576 / p007 · Electrical Conductivity · Figure S23 · Linked to 4 structured results
Names and aliases are kept exactly within the paper’s own identity model.
| Material | Composition | Structure context | Source |
|---|---|---|---|
| HATP-water-NS | HATP-derived nanosheet without nickelnone · HATP | 2D · UnknownNon-MOF nanosheet control; no crystalline MOF peaks observed. | 54572 / p003 · Experimental Section |
| HITP-Ni-NSBrowse family: Ni₃(HITP)₂ / Ni–HITP | Ni3(HITP)2-like nanosheetNi(II) · HITP (deprotonated 2,3,6,7,10,11-hexaaminotriphenylene) | 2D · PristinePlanar honeycomb Ni2+-HITP network with pi-pi stacked layers; metrically hexagonal in-plane cell. | 54571 / p002 · Introduction · Figure 1 |
| Ni3(HITP)2 bulk powderBrowse family: Ni₃(HITP)₂ / Ni–HITP | Ni3(HITP)2Ni(II) · HITP | 2D · PristineBulk polycrystalline layered 2D conductive MOF reference. | S4 / p004 · Synthesis of Ni3(HITP)2 bulk powder |
Sample form, processing state and composition status define the context for measurements.
| Sample | Form and role | Processing and geometry | Source |
|---|---|---|---|
| HATP-water-NS controlresearch_0094__mat__mat_hatp_water_ns | Nanosheet · Pristine Control · Unknown | HATP spread on pure water subphasepure water interface; transferred to Si or quartz as needed · about 4 nm | S3 / p003 · Synthesis of HATP-water-NS at air/liquid interfaces · Figure S2 |
| HATP-water-NS 10-cycle control deviceresearch_0094__mat__mat_hatp_water_ns | Electrode · Pristine Control · Unknown | control I-V deviceSiO2/Si with contacts · 10 deposition cycles | S30 / p030 · Figure S25 caption · Figure S25 |
| HITP-Ni-NS-2c top-contact deviceresearch_0094__mat__mat_hitp_ni_ns | Electrode · Target Sample · Pristine Framework | two transfer cyclesSiO2/Si with Au top contacts · 13.9 nm x 2 = 27.8 nm | 54576 / p007 · Electrical Conductivity · Figure S22 |
| HITP-Ni-NS-5c top-contact deviceresearch_0094__mat__mat_hitp_ni_ns | Electrode · Target Sample · Pristine Framework | five transfer cycles; 40 nm Au electrodes; laser isolationSiO2/Si with Au top contacts · 13.9 nm x 5 = about 70 nm | 54576 / p007 · Electrical Conductivity · Figure 6 |
| HITP-Ni-NS 5-cycle FET deviceresearch_0094__mat__mat_hitp_ni_ns | Electrode · Target Sample · Pristine Framework | field-effect transistor output measurementSiO2/Si FET geometry with Au contacts · five deposition cycles | S29 / p029 · Figure S24 caption · Figure S24 |
| HITP-Ni-NS at A/L interface, compressed to pi = 10 mN m-1research_0094__mat__mat_hitp_ni_ns | Nanosheet · Target Sample · Pristine Framework | air/liquid interfacial assembly with surface compressionair/aqueous Ni(OAc)2 interface · 13.9(2) nm after transfer; about 14 nm stated | 54571 / p002 · Experimental Section · Figure 2 |
| HITP-Ni-NS deposited immediately at pi = 0 mN m-1research_0094__mat__mat_hitp_ni_ns | Thin Film · Target Sample · Pristine Framework | deposited without surface compression immediately after HATP spreadingsolid substrates including Si and TEM grids | S4 / p004 · Synthesis of HITP-Ni-NS at air/liquid interfaces · Figures S3, S9, S10, S18 |
| HITP-Ni-NS on quartz after five deposition cyclesresearch_0094__mat__mat_hitp_ni_ns | Thin Film · Target Sample · Pristine Framework | successive layer-by-layer transferquartz · five deposition cycles; approximately 5 x 13.9 nm if same layer thickness applies | 54574 / p005 · Ligand-Metal Coordination Formation and Nanosheet Transparency · Figure 4 |
| HITP-Ni-NS on Si at pi = 10 mN m-1research_0094__mat__mat_hitp_ni_ns | Thin Film · Target Sample · Pristine Framework | horizontal dipping transfer from compressed A/L interfaceSi · 13.9 +/- 0.2 nm | 54573 / p004 · Nanosheet Morphology and Structure Confirmed by Ex Situ Microscopy · Figure 3 |
| HITP-Ni-NS carrier-transfer schematic modelresearch_0094__mat__mat_hitp_ni_ns | Model · Model System · Model | schematic transport-path interpretation | S28 / p028 · Figure S23 caption · Figure S23 |
| Ni3(HITP)2 bulk powder referenceresearch_0094__mat__mat_ni3_hitp2_bulk | Powder · Pristine Control · Pristine Framework | bulk polycrystalline powder | S4 / p004 · Synthesis of Ni3(HITP)2 bulk powder · Figures S12, S13 |