Microscopy Morphology — Uniaxially Oriented Electrically Conductive Metal-Organic Framework Nanosheets Assembled at Air/Liquid Interfaces

4 measurement groups · 11 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

HITP-Ni-NS on Si at pi = 10 mN m-1 · Thin Film

HITP-Ni-NS transferred onto Si at pi = 10 mN m-1.

Temperature: room temperature
Atmosphere: SEM in vacuo; AFM in dynamic force mode
Context: pristine target nanosheet
Measurement source: 54572-54573 / p003-p004 · Ex Situ Observation of Nanosheets on Solid Substrates · Figure 3, Figures S4 and S6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
average lateral size	53(1) nm	—	1 nm standard error	Caption Rounded Reported	S11 / p011 · Figure S6 caption · Figure S6
single-transfer nanosheet thickness	13.9(2) nm	—	0.2 nm standard error	Caption Rounded Reported	S11 / p011 · Figure S6 caption · Figure S6

HATP-water-NS control · Nanosheet

HATP-water-NS assembled on pure water and transferred onto Si.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
observed mean molecular area for HATP-water-NS	about 8 A2	—	—	Text Approximate	54573 / p004 · Creation of Nanosheets Confirmed by In Situ Observation · Figure S2
HATP-water-NS thickness	about 4 nm	—	—	Text Approximate	54574 / p005 · Nanosheet Morphology and Structure Confirmed by Ex Situ Microscopy · Figure S2

HITP-Ni-NS at A/L interface, compressed to pi = 10 mN m-1 · Nanosheet

HATP spread onto 50 mM aqueous Ni(OAc)2.4H2O; barriers compressed at 10 mm min-1.

Atmosphere: air/liquid interface, room temperature
Context: pristine target nanosheet
Measurement source: 54572 / p003 · Creation of Nanosheets Confirmed by In Situ Observation · Figure 2 and Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
observed mean molecular area for HITP-Ni-NS	about 19 A2	—	—	Text Approximate	54573 / p004 · Creation of Nanosheets Confirmed by In Situ Observation · Figure 2
first pi-A inflection point	10 mN m-1	—	—	Text Rounded Reported	54572 / p003 · Creation of Nanosheets Confirmed by In Situ Observation · Figure 2
second pi-A inflection point	18 mN m-1	—	—	Text Rounded Reported	54572 / p003 · Creation of Nanosheets Confirmed by In Situ Observation · Figure 2
estimated monolayer molecular area	about 198 A2 molecule-1	—	—	Text Approximate	54573 / p004 · Creation of Nanosheets Confirmed by In Situ Observation · Figure 2

HITP-Ni-NS on Si at pi = 10 mN m-1 · Thin Film

HITP-Ni-NS transferred onto Cu 200 mesh grids at pi = 0 and 10 mN m-1.

Temperature: room temperature
Atmosphere: TEM, 300 kV
Context: pristine target nanosheet
Measurement source: 54574 / p005 · Nanosheet Morphology and Structure Confirmed by Ex Situ Microscopy · Figure 3 and Figures S8-S10

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
hexagonal lattice size by HRTEM	about 2 nm	—	—	Text Approximate	54574 / p005 · Nanosheet Morphology and Structure Confirmed by Ex Situ Microscopy · Figure 3f,g and Figure S8
HRTEM crystalline domain size at pi = 0 mN m-1	about 10 nm	—	—	Text Approximate	54574 / p005 · Nanosheet Morphology and Structure Confirmed by Ex Situ Microscopy · Figures S9 and S10
HRTEM crystalline domain size at pi = 10 mN m-1	about 50 nm	—	—	Text Approximate	54574 / p005 · Nanosheet Morphology and Structure Confirmed by Ex Situ Microscopy · Figure 3