Diffraction Structure

synchrotron grazing-incidence XRD and out-of-plane XRD

HITP-Ni-NS on Si at pi = 10 mN m-1 · Thin Film

HITP-Ni-NS on Si; lambda = 1.24 Angstrom; in-plane incident angle alpha = 0.16 degrees; SPring-8 at room temperature under helium.

Temperature: room temperature
Atmosphere: helium gas
Context: pristine target nanosheet
Measurement source: 54572 and 54575 / p003-p006 · Grazing-Incident Synchrotron X-ray Diffraction Measurements · Figure 5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
in-plane lattice parameter a	a = 21.36(1) Angstrom	—	0.01 Angstrom	Text Exact Reported	54575 / p006 · Nanosheet Structure and Orientation Confirmed by Synchrotron X-ray Crystallography · Figure 5
in-plane lattice parameter b	b = 21.36(1) Angstrom	—	0.01 Angstrom	Text Exact Reported	54575 / p006 · Nanosheet Structure and Orientation Confirmed by Synchrotron X-ray Crystallography · Figure 5
Pawley refinement reliability factor Rwp	3.62%	—	—	Caption Exact Reported	S19 / p019 · Figure S14 caption · Figure S14
interlayer distance	3.22(1) Angstrom	—	0.01 Angstrom	Text Exact Reported	54575 / p006 · Nanosheet Structure and Orientation Confirmed by Synchrotron X-ray Crystallography · Figure 5d
out-of-plane diffraction peak Q	about 1.95 A-1	—	—	Text Approximate	54575 / p006 · Nanosheet Structure and Orientation Confirmed by Synchrotron X-ray Crystallography · Figure 5c

HATP-water-NS control · Nanosheet

HATP-water-NS on silicon substrate with 45 deposition cycles at pi = 10 mN m-1.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HATP-water-NS crystalline diffraction peaks	no peaks observed; halo in in-plane XRD	—	—	Caption Qualitative	S24 / p024 · Figure S19 caption · Figure S19

HITP-Ni-NS deposited immediately at pi = 0 mN m-1 · Thin Film

HITP-Ni-NS deposited at pi = 0 mN m-1; SmartLab Rigaku at room temperature; alpha = 0.19 degrees.

Temperature: room temperature
Context: zero-compression target sample
Measurement source: S5 and S23 / p005, p023 · Grazing-incident (GI) X-ray diffraction (XRD) measurements with Cu Kalpha X-ray source · Figure S18

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
pi = 0 and pi = 10 XRD/IR comparison	identical XRD profiles and IR spectra	—	—	Caption Qualitative	S23 / p023 · Figure S18 caption · Figure S18