Spectroscopy — Uniaxially Oriented Electrically Conductive Metal-Organic Framework Nanosheets Assembled at Air/Liquid Interfaces

Measurement evidence

Spectroscopy

Uniaxially Oriented Electrically Conductive Metal-Organic Framework Nanosheets Assembled at Air/Liquid Interfaces · Ohata T., Nomoto A., Watanabe T. et al. · ACS Applied Materials and Interfaces · 2021 · 54570-54578

2 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

UV-vis, UV-vis-IR and IR absorption spectroscopy

HITP-Ni-NS on quartz after five deposition cycles · Thin Film

HITP-Ni-NS and HATP-water-NS on quartz or Si substrates; room temperature.

Temperature
room temperature
Atmosphere
IR under vacuum conditions
Context
target compared with nickel-free control
Measurement source
54574 / p005 · Optical Absorption Spectroscopy · Figure 4 and Figures S11, S13
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
optical band gap of HATP-water-NSabout 1.1 eVCaption
Approximate
54574 / p005 · Figure 4 caption · Figure 4b
UV-vis-NIR absorption band1255.5 nmText
Exact Reported
54574 / p005 · Ligand-Metal Coordination Formation and Nanosheet Transparency · Figure 4a
UV-vis absorption band624.5 nmText
Exact Reported
54574 / p005 · Ligand-Metal Coordination Formation and Nanosheet Transparency · Figure 4a
optical band gapabout 0.2 eVCaption
Approximate
54574 / p005 · Figure 4 caption · Figure 4b
transmittance after one deposition cyclehigher than 99%lower boundText
Approximate
54574 / p005 · Ligand-Metal Coordination Formation and Nanosheet Transparency · Figure 4c,d
transmittance after five deposition cycleshigher than 93%lower boundText
Approximate
54575 / p006 · Ligand-Metal Coordination Formation and Nanosheet Transparency · Figure 4c,d
CN symmetric stretching band used for IR assignment1330 cm-1Caption
Exact Reported
S18 / p018 · Figure S13 caption · Figure S13
NH bending band used for IR assignment1640 cm-1Caption
Exact Reported
S18 / p018 · Figure S13 caption · Figure S13

X-ray photoelectron spectroscopy

HITP-Ni-NS on Si at pi = 10 mN m-1 · Thin Film

ULVAC-PHI PHI 5000 VersaProbeII with monochromatic Al Kalpha source under UHV.

Temperature
room temperature
Atmosphere
ultra-high vacuum
Context
target compared with HATP-water-NS and Ni3(HITP)2 bulk
Measurement source
S4-S5 / p004-p005 · X-ray photoelectron spectroscopy (XPS) · Figure S12
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
N/Ni atomic ratioabout 4Caption
Approximate
S17 / p017 · Figure S12 caption · Figure S12
nickel oxidation state+2Caption
Exact Reported
S17 / p017 · Figure S12 caption · Figure S12