Measurement evidence
Large-Area Synthesis of Ultrathin, Flexible, and Transparent Conductive Metal–Organic Framework Thin Films via a Microfluidic-Based Solution Shearing Process · Lee T., Kim J.-O., Park C. et al. · Advanced Materials · 2022 · 2107696
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
MASS-PRC Co3(HITP)2 thin film · Thin Film
Co3(HITP)2 thin film made by MASS-PRC; powder pattern obtained by scraping film multiple times.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Co3(HITP)2 PXRD structural confirmation | PXRD pattern of Co3(HITP)2 after scraping film multiple times | — | — | Caption Qualitative | 24 · Figure S10 caption · Figure S10 |
MASS-PRC Ni3(HITP)2 thin film · Thin Film
Thin film on SiO2 wafer for GIXD; powder collected by scraping thin film multiple times for PXRD.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| GIXD diffraction q values | 0.34, 0.67, 0.89, and 1.17 A-1 | — | — | Text Exact Reported | 2 · 2.1 Preparation of Ni3(HITP)2 Thin Film · Figure 1g |
| GIXD in-plane q for (100) | 0.34 A-1 | — | — | Text Exact Reported | 2 · 2.1 Preparation of Ni3(HITP)2 Thin Film · Figure 1g |
| GIXD in-plane q for (200) | 0.67 A-1 | — | — | Text Exact Reported | 2 · 2.1 Preparation of Ni3(HITP)2 Thin Film · Figure 1g |
| PXRD peak list | 4.8, 9.6, 12.6, and 16.4 deg corresponding to (100), (200), (210), and (220) | — | — | Text Exact Reported | 2 · 2.1 Preparation of Ni3(HITP)2 Thin Film · Figure 1h |
| PXRD (100) peak | 4.8 deg 2theta | — | — | Text Exact Reported | 2 · 2.1 Preparation of Ni3(HITP)2 Thin Film · Figure 1h |