GIXRD with in-plane and out-of-plane scattering geometries
100 nm Cu3(HHTP)2 thin film on LSMO/STO · Thin Film
100 nm Cu3(HHTP)2 film on LSMO/STO; incidence angle 0.2 deg; Cu Kalpha radiation.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| average crystalline domain size along substrate | approximately 16 nm from FWHM = 0.531 deg | — | — | Text Approximate | S9 · Analysis of Crystalline Domain Size · Figure S7 |
| average crystalline domain size perpendicular to substrate | ca. 9 nm from FWHM = 1.003 deg | — | — | Text Approximate | S9 · Analysis of Crystalline Domain Size · Figure S7 |
| preferred film orientation | face-on orientation | — | — | Qualitative Qualitative | 1119 · Results and Discussion · Figure 2a |
| in-plane GIXRD (100) reflection | 2theta = 4.7 deg | — | — | Text Rounded Reported | 1119 · Results and Discussion · Figure 2a |
| in-plane GIXRD (200) reflection | 2theta = 9.5 deg | — | — | Text Rounded Reported | 1119 · Results and Discussion · Figure 2a |
| in-plane GIXRD (210) reflection | 2theta = 12.6 deg | — | — | Text Rounded Reported | 1119 · Results and Discussion · Figure 2a |
| out-of-plane GIXRD (002) reflection | 2theta = 28.0 deg | — | — | Text Rounded Reported | 1119 · Results and Discussion · Figure 2a |