Microscopy Morphology — 2D Semiconducting Metal–Organic Framework Thin Films for Organic Spin Valves

Measurement evidence

Microscopy Morphology

2D Semiconducting Metal–Organic Framework Thin Films for Organic Spin Valves · Song X., Wang X., Li Y. et al. · Angewandte Chemie - International Edition · 2020 · 1118-1123

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

AFM, SEM, TEM

Scanning electron microscopy Transmission electron microscopy Atomic force microscopy

100 nm Cu3(HHTP)2 thin film on LSMO/STO · Thin Film

Cu3(HHTP)2 films with different growth cycles and 100 nm film morphology.

Geometry: thin films
Context: pristine MOF film morphology
Measurement source: S7 · Section 2 · Figures S2-S5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
RMS roughness of ca. 100 nm film	4.12 nm	—	—	Caption Exact Reported	S7 · Section 2 · Figure S4

Cross-sectional TEM-EDX and XPS

X-ray photoelectron spectroscopy Transmission electron microscopy Elemental microanalysis and mapping

Cu3(HHTP)2/Co/Au interfacial multilayers on Si · Thin Film

LSMO/Cu3(HHTP)2/Co/Au OSV interfaces and MOF/Co/Au multilayers with 30 and 70 nm MOF thicknesses.

Geometry: OSV cross-section and peeled multilayer films
Context: composite device interface
Measurement source: S14 · Section 7 · Figures S12-S13

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Co signal in 30 nm MOF/Co/Au multilayer	significant Co signal observed in MOF (30 nm)/Co/Au multilayers	—	—	Text Qualitative	S14 · Section 7 · Figure S13
Co signal in 70 nm MOF/Co/Au multilayer	no Co element detected in MOF (70 nm)/Co/Au multilayers	—	—	Text Qualitative	S14 · Section 7 · Figure S13