Spectroscopy — 2D Semiconducting Metal–Organic Framework Thin Films for Organic Spin Valves

Measurement evidence

Spectroscopy

2D Semiconducting Metal–Organic Framework Thin Films for Organic Spin Valves · Song X., Wang X., Li Y. et al. · Angewandte Chemie - International Edition · 2020 · 1118-1123

3 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

UPS and UV-vis-NIR optical bandgap analysis

Cu3(HHTP)2 thin film on quartz glass · Thin Film

100 nm Cu3(HHTP)2 thin film; HOMO and LUMO estimated from UPS and optical bandgap.

Temperature
300
Geometry
thin film on quartz/glass
Context
pristine MOF electronic levels for OSV energy alignment
Measurement source
S19 · Section 11 · Figure S21
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
optical bandgapEg = 0.58 eVText
Exact Reported
S19 · Section 11 · Figure S21
Co work function-4.9 eVText
Exact Reported
1121 · Results and Discussion · Figure S20
HOMO level-5.32 eVText
Exact Reported
S19 · Section 11 · Figure S21
LSMO work function-4.8 eVText
Exact Reported
1121 · Results and Discussion · Figure S20
LUMO level-4.74 eVText
Exact Reported
S19 · Section 11 · Figure S21

UV-Vis spectroscopy

Cu3(HHTP)2 thin film on quartz glass · Thin Film

Cu3(HHTP)2 films with different layer-by-layer growth cycle numbers on quartz glass.

Geometry
thin film on quartz glass
Context
pristine MOF film growth monitoring
Measurement source
1119 · Results and Discussion · Figure 2b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
ligand-to-metal charge-transfer absorbance band648 nmText
Exact Reported
1119 · Results and Discussion · Figure 2b
pi-pi* absorbance band363 nmText
Exact Reported
1119 · Results and Discussion · Figure 2b
film growth rateabout 5 nm per cycleText
Approximate
1119 · Results and Discussion · Figure 2c; Figure S2

X-ray photoelectron spectroscopy (XPS)

100 nm Cu3(HHTP)2 thin film on LSMO/STO · Thin Film

Cu3(HHTP)2 film survey and high-resolution Cu 2p3/2 spectra; C 1s charge reference.

Geometry
thin film
Context
pristine MOF film composition and valence
Measurement source
S11 · Section 5. X-ray Photoelectron Spectroscopy (XPS) Measurements · Figure S9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu 2p3/2 Cu(I) component932.9 eVText
Exact Reported
S11 · Section 5 · Figure S9
Cu 2p3/2 Cu(II) component934.8 eVText
Exact Reported
S11 · Section 5 · Figure S9