Diffraction Structure — Ultrafast in Situ Synthesis of Large-Area Conductive Metal-Organic Frameworks on Substrates for Flexible Chemiresistive Sensing

Measurement evidence

Diffraction Structure

Ultrafast in Situ Synthesis of Large-Area Conductive Metal-Organic Frameworks on Substrates for Flexible Chemiresistive Sensing · Chen X., Lu Y., Dong J. et al. · ACS Applied Materials and Interfaces · 2020 · 57235-57244

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction / Pawley-refined XRD

X-ray diffraction and scattering

Cu-BHT-5s film on Si/SiO2 · Thin Film

Cu Kalpha radiation; comparison with simulated Cu-BHT pattern

Atmosphere: ambient
Geometry: thin film on substrate
Context: pristine Cu-BHT film
Measurement source: p003-p004; article pages 57237-57238 · 3.2 Characterization · Figure 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AA stacking interval distance	3.38 A	—	—	Text Exact Reported	p004; article page 57238 · 3.1 Strategy · Figure 1f
XRD phase match	XRD patterns match simulated Cu-BHT pattern	—	—	Qualitative Qualitative	p004; article page 57238 · 3.2 Characterization · Figure 2b