Microscopy Morphology — Ultrafast in Situ Synthesis of Large-Area Conductive Metal-Organic Frameworks on Substrates for Flexible Chemiresistive Sensing

Measurement evidence

Microscopy Morphology

Ultrafast in Situ Synthesis of Large-Area Conductive Metal-Organic Frameworks on Substrates for Flexible Chemiresistive Sensing · Chen X., Lu Y., Dong J. et al. · ACS Applied Materials and Interfaces · 2020 · 57235-57244

2 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

AFM surface morphology

Atomic force microscopy

Cu-BHT film reaction-time series · Thin Film

5 x 5 um AFM images for 5 s and 2-14 min reaction times

Atmosphere: air
Geometry: thin film on substrate
Context: pristine Cu-BHT films
Measurement source: p003-p004; article pages 57237-57238 · 3.2 Characterization · Figure 2d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
12 min morphology	new Cu-BHT crystals fill grain boundaries; surface becomes smoother and denser	—	—	Text Qualitative	p004; article page 57238 · 3.2 Characterization · Figure 2d
5 s morphology	tiny crystal particles with numerous grain boundaries	—	—	Text Qualitative	p004; article page 57238 · 3.2 Characterization · Figure 2d

AFM height profiling

Atomic force microscopy

Cu-BHT film reaction-time series · Thin Film

Thickness measured at three positions versus reaction time

Atmosphere: air
Geometry: thin film on substrate
Context: pristine Cu-BHT films
Measurement source: p003-p004 · Figures S2-S3 · Figures S2, S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
thickness 16min	34.67 nm	—	—	Figure Axis Rounded Reported	p003 · Figure S2 · Figure S2
thickness 5s	5.42 nm	—	—	Figure Axis Rounded Reported	p003 · Figure S2 · Figure S2
thickness 8min	22.14 nm	—	—	Figure Axis Rounded Reported	p003 · Figure S2 · Figure S2
thickness growth rate	2.22 nm/min during first 10 min	—	—	Text Exact Reported	p004; article page 57238 · 3.2 Characterization · Figure S3
thickness range	5-35 nm	—	—	Text Range	p001; article page 57235 · 3.2 Characterization · Abstract