Measurement evidence
A Novel Electrically Conductive Perylene Diimide-Based MOF-74 Series Featuring Luminescence and Redox Activity · Scheurle P.I., Biewald A., Mahringer A. et al. · Small Structures · 2022 · 2100195
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
PDI-MOF-74(Mg) powder · Powder
Energy-dispersive X-ray spectroscopy on powders
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX-detected elements | C, N, O, Mg | — | — | Caption Qualitative | 26-27 · Energy dispersive X-ray spectra · Figure S13 |
PDI-MOF-74(Ni) powder · Powder
Energy-dispersive X-ray spectroscopy on powders
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX-detected elements | C, N, O, Ni plus small Cl impurity | — | — | Caption Qualitative | 26-27 · Energy dispersive X-ray spectra · Figure S14 |
PDI-MOF-74(Zn) powder · Powder
Energy-dispersive X-ray spectroscopy on powders
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| EDX-detected elements | C, N, O, Zn | — | — | Caption Qualitative | 26-27 · Energy dispersive X-ray spectra · Figure S12 |
PDI-MOF-74(Zn) VAC film on glass · Thin Film
SEM of PDI-MOF-74(Zn) film grown on glass via VAC
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| film surface coverage | homogeneous surface coverage | — | — | Text Qualitative | 3 · Results and Discussion · Figure S30 |
| film thickness | around 17 um | — | — | Text Approximate | 3, SI 35 · Results and Discussion · Figure S30 |
PDI-MOF-74(Mg) powder · Powder
TEM at 300 kV; SEM at 2 kV; powder morphology and crystallinity
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| TEM domain length | 400-530 nm | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |
| TEM domain width | 40-90 nm | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |
| SEM crystallite length | 400-900 nm | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |
| SEM crystallite width | 80-100 nm | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |
PDI-MOF-74(Ni) powder · Powder
TEM at 300 kV; SEM at 2 kV; powder morphology and crystallinity
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| SEM crystallite length | 2.5-5 um | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |
| SEM crystallite width | 500 nm-1.2 um | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |
PDI-MOF-74(Zn) powder · Powder
TEM at 300 kV; SEM at 2 kV; powder morphology and crystallinity
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| SEM crystallite length | 1-3 um | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |
| SEM crystallite width | 100-300 nm | — | — | Text Range | 3 · Results and Discussion · Figure 3; Figures S5-S11 |