solid-state thin-film UV-vis absorption and Tauc plot
ITO/compound 1/Al metal-semiconductor thin-film device · Thin Film
Solid-state thin film absorbance of compound 1 deposited on quartz plate and dried in vacuum chamber; optical direct band gap calculated using Tauc equation with n = 1/2.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| experimental optical direct band gap | 3.83 eV | — | — | Text Exact Reported | rendered page 3 / article p.19939 · Optical and Electrical Characterization · Figure 4 |
| experimental optical direct band gap reported in SI | 3.74 eV | — | — | Text Exact Reported | rendered page 18 / SI p.S18 · Optical Characterization · Equation S1; Figure 4 |