cMOF Evidence Base
Diffraction Structure — High-Performance Ni3(HHTP)2 Film-Based Flexible Field-Effect Transistor Gas Sensors

Measurement evidence

Diffraction Structure

High-Performance Ni3(HHTP)2 Film-Based Flexible Field-Effect Transistor Gas Sensors · Lu G., Zong B., Tao T. et al. · ACS Sensors · 2024 · 1916-1926

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

X-ray diffraction (XRD)

X-ray diffraction and scattering

Prepared Ni3(HHTP)2 material · Powder

XRD pattern of prepared Ni3(HHTP)2.

Context
Pristine framework phase assignment
Measurement source
p003 · Results and Discussion · Figure 2c
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Characteristic XRD peak positions4.6, 9.3, 13.8, 16.1, 21.3, and 26.8 deg assigned to (100), (200), (210), (220), (221), and (004)——Text
Rounded Reported		p003 · Results and Discussion · Figure 2c