SEM cross-section and top-view imaging
Ni3(HHTP)2 film FET sensor on PI · Thin Film
Ni3(HHTP)2 film deposited on PI substrate; cross-section used for film thickness and top view for morphology.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni3(HHTP)2 film thickness on PI | ~788.2 nm | — | — | Text Approximate | p003 · Results and Discussion · Figure 2a |
| Film morphology | vertically aligned nanorods; closely packed rod forest morphology | — | — | Text Qualitative | p003 · Results and Discussion · Figure 2a,b |