cMOF Evidence Base
Diffraction Structure — Orientation Control of a Two-Dimensional Conductive Metal-Organic Framework Thin Film by a Pyridine Vapor-Assisted Dry Process

Measurement evidence

Diffraction Structure

Orientation Control of a Two-Dimensional Conductive Metal-Organic Framework Thin Film by a Pyridine Vapor-Assisted Dry Process · Chon S., Nakayama R., Iwamoto S. et al. · ACS Applied Materials and Interfaces · 2023 · 56057-56063

2 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

out-of-plane and in-plane X-ray diffraction; Cu Kalpha radiation, Rigaku SmartLab, five-axis goniometer

X-ray diffraction and scattering

(001)-oriented Cu3(HHTP)2 thin film annealed with 3 uL pyridine · Thin Film

XRD orientation analysis of the pyridine-vapour annealed Cu3(HHTP)2 thin film.

Geometry
thin film on alpha-Al2O3 (001)
Context
pristine framework
Measurement source
p004 · Results and Discussion · Figure 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
in-plane XRD 100 reflection4.8 degrees——Text
Rounded Reported		p004 · Results and Discussion · Figure 4b
in-plane XRD 200 reflection9.4 degrees——Text
Rounded Reported		p004 · Results and Discussion · Figure 4b
in-plane XRD 210 reflection12.6 degrees——Text
Rounded Reported		p004 · Results and Discussion · Figure 4b
interlayer spacing from 002 reflection3.2 Angstrom——Text
Rounded Reported		p004 · Results and Discussion · Figure 4a
(001)-oriented film assignment(001)-oriented Cu3(HHTP)2 thin film with random in-plane orientation——Text
Qualitative		p004 · Results and Discussion · Figure 4c
out-of-plane XRD 002 reflectionbroad diffraction peak near 27.7 degrees attributed to 002——Text
Approximate		p004 · Results and Discussion · Figure 4a

out-of-plane and in-plane X-ray diffraction

X-ray diffraction and scattering

as-deposited Cu3(HHTP)2-like thin film on alpha-Al2O3 (001) · Thin Film

SI XRD patterns of as-deposited Cu3(HHTP)2 thin film on alpha-Al2O3 (001).

Geometry
thin film on alpha-Al2O3 (001)
Context
pristine framework-like film
Measurement source
p003 · Figure caption · Figure S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
as-deposited film crystallinityabsence of noticeable peaks; film was not crystallized——Caption
Qualitative		p003 · Figure caption · Figure S3