PXRD / powder diffractogram
HKUST-1 coating on 5 cm x 5 cm copper sheet · Thin Film
Powder diffraction patterns measured using Bruker D8 Advance with Cu-Kalpha radiation and LYNXEYE detector, Bragg-Brentano geometry, 4 s/0.01 deg per step.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| bottom-layer crystalline Cu2O assignment | Cu2O present | — | — | Qualitative Qualitative | 9709 · Results · Figure 3 |
| bottom-layer crystalline rouaite assignment | Cu2(NO3)(OH)3 (rouaite) present | — | — | Qualitative Qualitative | 9709 · Results · Figure 3 |
| major crystalline phaseMarked as a best value within this paper | HKUST-1 major crystalline phase confirmed | — | — | Qualitative Qualitative | 9709 · Results · Figure 3 |