Measurement evidence
Nanoporous synthetic metal: A nickel MOF with an amino-functionalized macrocyclic ligand · Pham H.T.B., Fang X., Choi J.Y. et al. · Chem · 2025 · 102487
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Cu-HATC powders · Powder
Cu-HATC powder spectrum reported in Figure S36
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| alkyne stretching vibration | C≡C stretching vibration highlighted in orange. | — | — | Caption Qualitative | 29 · Figure S36 · S36 |
Cu-HATC powders · Powder
UPS spectra with zoomed low-binding-energy edge
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| UPS low-binding-energy edge | ELBEE = 0.19 eV | — | — | Figure Axis Exact Reported | 38 · Figure S48A · S48A |
Cu-HATC powders · Powder
Solid-state UV-vis-NIR absorbance and derived Tauc plot
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical band gap | 0.49 eV | — | — | Text Exact Reported | p. 5 · Electronic properties of structural analogs · Figure S47 |
Cu-HATC powders · Powder
Survey and high-resolution C 1s, N 1s, Cu 2p scans
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu 2p3/2 binding energy assigned to Cu(I) | 932.0 eV Cu(I) | — | — | Figure Axis Exact Reported | 32 · Figure S40D · S40D |
| Cu 2p3/2 binding energy assigned to Cu(II) | 934.1 eV Cu(II) | — | — | Figure Axis Exact Reported | 32 · Figure S40D · S40D |
| metal:ligand ratio by XPS | 3:1.9 | — | — | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |
| C atomic percent by XPS | 80.6 +/- 3.2 atomic % | — | +/- 3.2 | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |
| Cu atomic percent by XPS | 4.0 +/- 0.4 atomic % | — | +/- 0.4 | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |
| N atomic percent by XPS | 15.4 +/- 3.0 atomic % | — | +/- 3.0 | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |
Cu-HHTC powders · Powder
UPS spectra with zoomed low-binding-energy edge
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| UPS low-binding-energy edge | ELBEE = 0.28 eV | — | — | Figure Axis Exact Reported | 38 · Figure S48B · S48B |
Cu-HHTC powders · Powder
Solid-state UV-vis-NIR absorbance and derived Tauc plot
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical band gap | 0.72 eV | — | — | Text Exact Reported | p. 5 · Electronic properties of structural analogs · Figure S47 |
Ni-HATC bulk powders · Powder
Compare HATC ligand and Ni-HATC spectra
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| C triple C stretching band | around 2230 cm-1 | — | — | Text Approximate | p. 3 · Synthesis and characterization of Ni-HATC · Figure S25 |
| N-H stretching after MOF formation | N-H stretching 3200-3400 cm-1 disappeared | — | — | Text Qualitative | p. 3 · Synthesis and characterization of Ni-HATC · Figure S25 |
Ni-HATC thin film on glass · Thin Film
UPS low-binding-energy edge near Fermi level
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| UPS LBEE interpretation | bands crossing the Fermi level | — | — | Text Qualitative | p. 4 · Electronic properties of structural analogs · Figure 3C |
Ni-HATC thin film on glass · Thin Film
MOF thin film measured on CARY 5000; spectral trend compared with Cu-HATC and Cu-HHTC
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| NIR absorption tail | broad absorption tail beyond 2000 nm | — | — | Text Approximate | p. 5 · Electronic properties of structural analogs · Figure 3D |
Ni-HATC bulk powders · Powder
Survey and high-resolution C 1s, N 1s, Ni 2p scans; calibrated to C-C sp2 at 284.1 eV
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| metal:ligand ratio by XPS | 3:2.3 | — | — | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |
| N 1s =NH binding energy | 397.5 eV | — | — | Text Exact Reported | p. 3 · Synthesis and characterization of Ni-HATC · Figure S27 |
| N 1s -NH- binding energy | 398.9 eV | — | — | Text Exact Reported | p. 3 · Synthesis and characterization of Ni-HATC · Figure S27 |
| Ni 2p3/2 binding energy | 854.8 eV | — | — | Text Exact Reported | p. 3 · Synthesis and characterization of Ni-HATC · Figure S27 |
| C atomic percent by XPS | 79.9 +/- 0.5 atomic % | — | +/- 0.5 | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |
| N atomic percent by XPS | 16.6 +/- 1.0 atomic % | — | +/- 1.0 | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |
| Ni atomic percent by XPS | 3.5 +/- 0.5 atomic % | — | +/- 0.5 | SI Table Exact Reported | S32 · XPS of Cu-HATC · Table S3 |