Diffraction Structure — Electrically regulating nonlinear optical limiting of metal-organic framework film

Measurement evidence

Diffraction Structure

Electrically regulating nonlinear optical limiting of metal-organic framework film · Ma Z.-Z., Li Q.-H., Wang Z. et al. · Nature Communications · 2022 · 6347

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Out-of-plane and in-plane XRD

X-ray diffraction and scattering

Cu-HHTP[001] film · Thin Film

MiniFlex2 X-ray diffractometer, Cu Kalpha radiation, 2theta range 3-30 deg, scan rate 0.5 deg min-1; compared to simulated pattern and powder.

Geometry: thin films on substrate
Context: Pristine oriented Cu-HHTP films on ITO; measurement includes both [001] and [100] films.
Measurement source: 2-3, 7 · Characterization; Materials and instrumentation · Fig. 2b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-HHTP[001] in-plane (100)/(200) peaks	4.6 and 9.5 deg	—	—	Text Rounded Reported	2 · Characterization · Fig. 2b
Cu-HHTP[001] out-of-plane (001) peak	27.7 deg	—	—	Text Rounded Reported	2 · Characterization · Fig. 2b
Cu-HHTP[100] in-plane (010)/(020)/(001) peaks	4.6, 9.5 and 27.7 deg	—	—	Text Rounded Reported	2 · Characterization · Fig. 2b
Cu-HHTP[100] out-of-plane (100)/(200)/(210) peaks	4.6, 9.5 and 12.6 deg	—	—	Text Rounded Reported	2 · Characterization · Fig. 2b