Electrical Transport — Electrically regulating nonlinear optical limiting of metal-organic framework film

2 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-HHTP[001] film · Thin Film

Nyquist-type EIS spectra for oriented thin films; interfacial resistance reported.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-HHTP[001] interfacial resistanceMarked as a best value within this paper	77.95 Ohm cm2	—	—	Text Exact Reported	3 · Characterization · Supplementary Fig. 7a
Cu-HHTP[100] interfacial resistance	237.74 Ohm cm2	—	—	Text Exact Reported	3 · Characterization · Supplementary Fig. 7b

Cu-HHTP[001] film · Thin Film

Vertical devices; voltage swept from about -2 to +2 V as shown in Fig. 3a.

Geometry: vertical two-probe device
Context: Pristine oriented Cu-HHTP films on electrodes; [001] and [100] compared.
Measurement source: 3-4 · Characterization · Fig. 3a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-HHTP[001] current at +2 V	approximately +8 x 10^-1 A at +2 V	—	—	Figure Axis Approximate	4 · Characterization · Fig. 3a
Cu-HHTP[100] current at +2 V	approximately +1.5 x 10^-1 A at +2 V	—	—	Figure Axis Approximate	4 · Characterization · Fig. 3a