cMOF Evidence Base
Other — Electrically regulating nonlinear optical limiting of metal-organic framework film

Measurement evidence

Other

Electrically regulating nonlinear optical limiting of metal-organic framework film · Ma Z.-Z., Li Q.-H., Wang Z. et al. · Nature Communications · 2022 · 6347

2 measurement groups · 21 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Open-aperture Z-scan nonlinear optical limiting

Cu-HHTP[001] film · Thin Film

Nd:YAG laser, 5 Hz repetition, 5 ns pulse, 532 nm wavelength; 80 uJ for orientation comparison; room temperature.

Geometry
thin films on computer-controlled translation stage; bare ITO reference
Context
Pristine Cu-HHTP[001] and Cu-HHTP[100] films; ITO blank reference.
Measurement source
4, 7 · The third-order NLO test; Z-scan measurements · Fig. 4a-d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu-HHTP[001] nonlinear absorption coefficient beta at 0 V~7.60 x 10^-6 m/W——Text
Approximate		1, 4 · Abstract; The third-order NLO test · Fig. 4d; Supplementary Table 1
Cu-HHTP[100] nonlinear absorption coefficient beta at 0 V~0.84 x 10^-6 m/W——Text
Approximate		1, 4 · Abstract; The third-order NLO test · Fig. 4d; Supplementary Table 1
Cu-HHTP powder beta1.33 x 10^-9 m/W——SI Table
Rounded Reported		18-19 · Supplementary Table 1 · Supplementary Table 1
Cu-HHTP[001] linear transmittance before voltage70%0.7 fraction—Text
Rounded Reported		4 · The third-order NLO test · Fig. 4a
Cu-HHTP[100] linear transmittance before voltage61%0.61 fraction—Text
Rounded Reported		4 · The third-order NLO test · Fig. 4a
Cu-HHTP[001] minimum normalised transmittance at Z=0, 0 Vabout 0.700.7 fraction—Text
Approximate		4 · The third-order NLO test · Fig. 4a
Cu-HHTP[100] minimum normalised transmittance at Z=0, 0 Vabout 0.850.85 fraction—Text
Approximate		4 · The third-order NLO test · Fig. 4a

Voltage-dependent open-aperture Z-scan nonlinear optical limiting

ITO-Cu-HHTP[001]-ITO sandwich device · Electrode

ITO-MOF-ITO sandwich devices under 0, 2, 4, 6, 8 and 10 V applied voltage; high voltage above this avoided because it can destroy the MOF.

Geometry
sandwich ITO-MOF-ITO
Context
Composite device geometry with pristine Cu-HHTP film active layer.
Measurement source
5-6 · The third-order NLO test · Fig. 5; Supplementary Figs. 8-9
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu-HHTP[001] beta at 10 VMarked as a best value within this paper3.84 x 10^-5 m/W——Text
Rounded Reported		1, 5 · Abstract; The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[001] beta at 2 V1.61 x 10^-5 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[001] beta at 4 V2.39 x 10^-5 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[001] beta at 6 V3.12 x 10^-5 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[001] beta at 8 V3.62 x 10^-5 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[100] beta at 10 V1.71 x 10^-6 m/W——Text
Rounded Reported		1, 5 · Abstract; The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[100] beta at 2 V1.10 x 10^-6 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[100] beta at 4 V1.35 x 10^-6 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[100] beta at 6 V1.54 x 10^-6 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[100] beta at 8 V1.66 x 10^-6 m/W——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5d; Supplementary Table 1
Cu-HHTP[001] beta voltage-growth R valueMarked as a best value within this paperR = 9——Text
Exact Reported		6 · The third-order NLO test · Fig. 5e
Cu-HHTP[100] beta voltage-growth R valueapproximately 2——Figure Axis
Approximate		6 · The third-order NLO test · Fig. 5e
Cu-HHTP[001] Tmin series at 0, 2, 4, 6, 8 and 10 V0.70, 0.56, 0.48, 0.41, 0.39 and 0.37——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5b
Cu-HHTP[100] Tmin series at 0, 2, 4, 6, 8 and 10 V0.85, 0.83, 0.78, 0.76, 0.75 and 0.74——Text
Rounded Reported		5 · The third-order NLO test · Fig. 5c