Microscopy Morphology — Electrically regulating nonlinear optical limiting of metal-organic framework film

Measurement evidence

Microscopy Morphology

Electrically regulating nonlinear optical limiting of metal-organic framework film · Ma Z.-Z., Li Q.-H., Wang Z. et al. · Nature Communications · 2022 · 6347

1 measurement group · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, AFM, TEM, HRTEM and SAED

Scanning electron microscopy Transmission electron microscopy Atomic force microscopy

Cu-HHTP[001] film · Thin Film

SEM (JSM6700), TEM (JEM-2010F), AFM (Bruker Dimension ICON) for surface, cross-section, smoothness, nanosheets and lattice spacing.

Geometry: thin films and scraped nanosheets
Context: Pristine Cu-HHTP films; includes [001] main figures and [100] supplementary figures.
Measurement source: 3, 7 · Characterization; Materials and instrumentation · Fig. 2c-h; Supplementary Figs. 1-2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-HHTP HRTEM lattice spacing	~1.87 nm	—	—	Text Approximate	3 · Characterization · Fig. 2h; Supplementary Figs. 1f, 2b
Cu-HHTP[001] film thickness	about 60 nm	—	—	Text Approximate	3 · Characterization · Fig. 2d
Cu-HHTP[100] film thickness	about 120 nm	—	—	Text Approximate	3 · Characterization · Supplementary Fig. 1c