Diffraction Structure — Charge. transport, conductivity and Seebeck coefficient in pristine and TCNQ loaded preferentially grown metal-organic framework films

Measurement evidence

Diffraction Structure

Charge. transport, conductivity and Seebeck coefficient in pristine and TCNQ loaded preferentially grown metal-organic framework films · Chen X., Zhang K., Hassan Z.M. et al. · Journal of Physics Condensed Matter · 2022 · 404001

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

X-ray diffraction, D8-Advance Bruker AXS, Cu Kalpha radiation, theta/2theta geometry

X-ray diffraction and scattering

Random polycrystalline TCNQ-loaded HKUST-1 SURMOF film on borosilicate glass, ca. 130 nm · Thin Film

XRD of random polycrystalline HKUST-1 SURMOF before and after TCNQ loading.

Geometry: thin film on substrate
Context: guest-loaded compared with pristine control
Measurement source: article pages 3-4 · Figure 1 discussion · Figure 1(B)

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Framework retained after TCNQ loading by XRD	TCNQ loading did not alter or disturb the HKUST-1 crystal structure	—	—	Caption Qualitative	article page 3 · Figure 1 caption · Figure 1(B)