Electrical Transport — Charge. transport, conductivity and Seebeck coefficient in pristine and TCNQ loaded preferentially grown metal-organic framework films

7 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Random polycrystalline TCNQ-loaded HKUST-1 SURMOF film on borosilicate glass, ca. 130 nm · Thin Film

Conductivity of approximately 130 nm TCNQ-loaded random polycrystalline HKUST-1 film on insulating borosilicate glass over 260-350 K.

Temperature: 260-350
Geometry: Van der Pauw bottom-contact thin-film geometry
Context: guest-loaded random polycrystalline film
Measurement source: article page 8 · 1.2 Thin-film electrical conductometry · Figure 10

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Activation energy for TCNQ-loaded borosilicate film	0.13 eV over 300-350 K	0.13 eV	—	Text Rounded Reported	article page 9 · 1.2 Thin-film electrical conductometry · Figure 10(b)
TCNQ-loaded borosilicate film conductivity at 260 K	7.129 x 10-4 S cm-1 at 260 K	0.0007129 S cm^-1	—	Text Exact Reported	article page 8 · 1.2 Thin-film electrical conductometry · Figure 10(a)
TCNQ-loaded borosilicate film conductivity at 350 KMarked as a best value within this paper	3.1 x 10-3 S cm-1 at 350 K	0.0031 S cm^-1	—	Text Rounded Reported	article page 8 · 1.2 Thin-film electrical conductometry · Figure 10(a)

Random polycrystalline TCNQ-loaded HKUST-1 SURMOF film on hydroxyl-terminated SiO2/Si · Thin Film

TCNQ-loaded SURMOF film on 40 nm isolation SiO2 covered Si with bottom Au contacts.

Temperature: 300-350
Geometry: Van der Pauw bottom-contact thin-film geometry
Context: guest-loaded compact SiO2/Si film
Measurement source: article pages 8-9 · 1.2 Thin-film electrical conductometry · Figure 11

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Activation energy for TCNQ-loaded SiO2/Si film	0.043 eV	0.043 eV	Figure 11(b) label: +/-0.0006 eV	Text Exact Reported	article page 9 · 1.2 Thin-film electrical conductometry · Figure 11(b)
TCNQ-loaded SiO2/Si film conductivity at 300 K	approximately 0.023 S cm-1 at 300 K from Figure 11(a)	0.023 S cm^-1	visual estimate, about +/-0.003 S cm-1	Figure Axis Approximate	article page 8 · Figure 11 · Figure 11(a)
TCNQ-loaded SiO2/Si film conductivity at 350 KMarked as a best value within this paper	approximately 0.040 S cm-1 at 350 K from Figure 11(a)	0.04 S cm^-1	visual estimate, about +/-0.003 S cm-1	Figure Axis Approximate	article page 8 · Figure 11 · Figure 11(a)

Random polycrystalline TCNQ-loaded HKUST-1 SURMOF film on borosilicate glass, ca. 130 nm · Thin Film

Attempted Hall coefficient, Hall mobility and carrier density measurements from 260-350 K; 0.55 T permanent magnet and repeated 1-6 T PPMS fields.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Contact resistance preventing reproducible Hall measurements	in excess of 1-2 MOhm	1000000 Ohm	range lower bound	Text Range	article page 9 · 1.2 Thin-film electrical conductometry
Carrier type from attempted Hall measurements	positive Hall coefficient; p-type, holes	—	quantitative Hall measurements not reproducible	Text Qualitative	article page 9 · 1.2 Thin-film electrical conductometry

Preferentially (001)-oriented pristine HKUST-1 SURMOF film, 100 nm · Thin Film

In-plane I-V from -10 V to 10 V on preferentially (001)-oriented pristine HKUST-1 film on functionalized quartz.

Geometry: lateral in-plane current path parallel to film surface
Context: pristine oriented control
Measurement source: article page 7 · 1.2 Thin-film electrical conductometry · Figure 9(a)

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Preferentially oriented pristine film lateral current	zero lateral in-plane current from -10 V to 10 V	0 A	not measurable within Figure 9 current scale	Text Qualitative	article page 7 · 1.2 Thin-film electrical conductometry · Figure 9(a)

Preferentially (001)-oriented TCNQ-loaded HKUST-1 SURMOF film, 100 nm · Thin Film

In-plane I-V from -10 V to 10 V on preferentially oriented TCNQ-loaded HKUST-1 film on functionalized quartz.

Geometry: lateral in-plane current path parallel to film surface
Context: guest-loaded oriented sample
Measurement source: article page 7 · 1.2 Thin-film electrical conductometry · Figure 9(b)

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Preferentially oriented TCNQ-loaded film lateral current	zero lateral in-plane current from -10 V to 10 V	0 A	not measurable within Figure 9 current scale	Text Qualitative	article page 7 · 1.2 Thin-film electrical conductometry · Figure 9(b)

Random polycrystalline pristine HKUST-1 SURMOF film on borosilicate glass, ca. 130 nm · Thin Film

Lateral in-plane I-V between Au contacts on pristine random polycrystalline film on borosilicate glass.

Geometry: 1 cm x 1 cm square sample with four Au contacts
Context: pristine control
Measurement source: article page 7 · 1.2 Thin-film electrical conductometry · Figure 8(b)

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Pristine borosilicate film lateral current	practically zero conductivity; current fluctuates around 0 nA over -10 to +10 V	0 A	noise-level current in Figure 8(b)	Text Qualitative	article page 7 · 1.2 Thin-film electrical conductometry · Figure 8(b)

Random polycrystalline TCNQ-loaded HKUST-1 SURMOF film on borosilicate glass, ca. 130 nm · Thin Film

Lateral in-plane I-V between Au contact pairs AB, BC, CD and DA on TCNQ-loaded random polycrystalline film.

Geometry: 1 cm x 1 cm square sample with four Au contacts; bottom contacts used to avoid surface damage
Context: guest-loaded compared with pristine glass-supported film
Measurement source: article pages 6-7 · 1.2 Thin-film electrical conductometry · Figure 8(a)

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
TCNQ-loaded borosilicate film current at positive high bias	approximately 60-100 nA near +9 to +10 V, depending on contact pair	1e-7 A	contact-pair-dependent; visual estimate from plot	Figure Axis Range	article page 7 · Figure 8 · Figure 8(a)