Microscopy Morphology — Charge. transport, conductivity and Seebeck coefficient in pristine and TCNQ loaded preferentially grown metal-organic framework films

3 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Random polycrystalline pristine HKUST-1 SURMOF film on borosilicate glass, ca. 130 nm · Thin Film

Planar morphology of pristine and TCNQ-loaded HKUST-1 films on borosilicate glass after 10 and 40 cycles.

Geometry: top-down thin-film morphology
Context: pristine and guest-loaded random polycrystalline films
Measurement source: article pages 5 and 8 · Figure 4 and 1.2 Thin-film electrical conductometry · Figure 4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Borosilicate film thickness after 10 cycles	approximately 40 nm	40 nm	—	Text Approximate	article page 8 · 1.2 Thin-film electrical conductometry · Figure 4
Borosilicate film thickness after 40 cycles	approximately 130 nm	130 nm	—	Text Approximate	article page 8 · 1.2 Thin-film electrical conductometry · Figures 4 and 10

Preferentially (001)-oriented pristine HKUST-1 SURMOF film, 100 nm · Thin Film

Cross sections of HKUST-1 SURMOF films on silicon substrates for thickness calibration across spray cycles.

Geometry: thin film cross-section on Al-SEM cross-section holder
Context: pristine framework thickness series
Measurement source: article page 4 · Figure 3 and surrounding text · Figure 3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Film thickness after 15 LPE spray cycles	approximately 40 nm	40 nm	—	Text Approximate	article page 4 · Figure 3 discussion · Figure 3
Film thickness after 25 LPE spray cycles	approximately 60 nm	60 nm	—	Text Approximate	article page 4 · Figure 3 discussion · Figure 3
Film thickness after 30 LPE spray cycles	approximately 70 nm	70 nm	—	Text Approximate	article page 4 · Figure 3 discussion · Figure 3
Film thickness after 45 LPE spray cycles	approximately 100 nm	100 nm	—	Text Approximate	article page 4 · Figure 3 discussion · Figure 3

Random polycrystalline pristine HKUST-1 SURMOF film on hydroxyl-terminated SiO2/Si · Thin Film

Pristine and TCNQ-loaded random polycrystalline HKUST-1 films on hydroxyl-terminated SiO2/Si.

Geometry: top-down thin-film morphology
Context: pristine and guest-loaded compact films
Measurement source: article page 8 · 1.2 Thin-film electrical conductometry · Figure 5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source