powder X-ray diffraction / synchrotron out-of-plane XRD
IC-MOF thin film on quartz or silicon wafer · Thin Film
Layer-stacking reflections of MOF thin film indexed as (001) and (002).
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| IC-MOF interlayer spacing | 7.123(5) Angstrom | — | (5) | Text Exact Reported | 907 · MOF Synthesis and Sensing Setup · Figure S2B |