Measurement evidence
Ultrasensitive Detection of Electrolyte Leakage from Lithium-Ion Batteries by Ionically Conductive Metal-Organic Frameworks · Lu Y., Zhang S., Dai S. et al. · Matter · 2020 · 904-919
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
IC-MOF thin film on quartz or silicon wafer · Thin Film
FTIR spectra of IC-MOF thin films compared with H2TCPP ligand.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| new FTIR peak after MOF formation | 1,620 cm-1 | — | — | Text Rounded Reported | 907 · MOF Synthesis and Sensing Setup · Figure S2A |
| new FTIR peak after MOF formation | 1,935 cm-1 | — | — | Text Rounded Reported | 907 · MOF Synthesis and Sensing Setup · Figure S2A |
IC-MOF thin film on quartz or silicon wafer · Thin Film
UV-vis spectra of MOF thin films and H2TCPP; later spectra before and after DMC/ethanethiol exposure.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| IC-MOF peak after DMC exposure | 420 nm | — | — | Text Exact Reported | 914 · Sensing Mechanism · Figure 6B |
| IC-MOF characteristic UV-vis peak | 425 nm | — | — | Text Exact Reported | 914 · Sensing Mechanism · Figure 6B |
| IC-MOF peak after ethanethiol treatment | 412 nm | — | — | Text Exact Reported | 914 · Sensing Mechanism · Figure 6B |
IC-MOF thin film on quartz or silicon wafer · Thin Film
Cu 3p spectra of IC-MOF thin films compared with Cu(NO3)2.2H2O bulk powder.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| copper oxidation state | +2 | — | — | Text Exact Reported | 907 · MOF Synthesis and Sensing Setup · Figure S2C |