SEM, cross-section SEM, AFM, TEM/HRTEM
IC-MOF thin film on quartz or silicon wafer · Thin Film
Surface/cross-section morphology and thickness of IC-MOF thin films; AFM thickness variants.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| typical IC-MOF film thicknessMarked as a best value within this paper | about 150 nm | — | — | Text Approximate | 907 · MOF Synthesis and Sensing Setup · Figures S3A and S4 |