Metal precursorsNiCl2.6H2O and CuSO4.5H2O, feeding Ni:Cu 7:1
Linker precursorsHATP.6HCl
Solventsdeionised water
AdditivesNH3.H2O
Atmospherenot reported
Temperature65
Time1
Substrate orientationSi/SiO2 wafer (SiO2 285 +/- 10 nm, p-type doped), 2.5 x 2 cm2 chip; ultraviolet lithography/lift-off defined 50 um x 1000 um channel; Ti 10 nm/Au 100 nm source-drain electrodes by magnetron sputtering. Cleaned FET suspended upside down on reaction solution surface.
Work-upFET device UV-ozone cleaned for about 30-60 min, suspended upside down on reaction solution, heated in water bath at 65 degC for 60 min, cooled to room temperature, rinsed with deionized water and ethanol several times, then dried in vacuum oven at 100 degC for 120 min; silicon rubber used to form liquid cell.
Activationvacuum oven drying at 100 degC for 120 min
Scalability contextAuthors state large, uniform films were grown in situ on pre-prepared FET devices.
Show 5 structured reagent records
| Role | Reagent | Amount / concentration | Source |
|---|
| Metal Source | NiCl2.6H2O | 6.6 g (0.028 mmol; source text likely has unit inconsistency) | 2 · 2.2 · Fig. 1 |
| Metal Source | CuSO4.5H2O | 1.0 g (0.004 mmol; source text likely has unit inconsistency) | 2 · 2.2 · Fig. 1 |
| Solvent | deionized water | 5 mL for metal solution; 5 mL for ligand solution | 2 · 2.2 · Fig. 1 |
| Base | NH3.H2O | 0.3 mL | 2 · 2.2 · Fig. 1 |
| Linker | HATP.6HCl | 10.0 mg (0.028 mmol) | 2 · 2.2 · Fig. 1 |