cMOF Evidence Base
Diffraction Structure — Adjustable Synthesis of Ni-Based Metal-Organic Framework Membranes and Their Field-Effect Transistor Sensors for Mercury Detection

Measurement evidence

Diffraction Structure

Adjustable Synthesis of Ni-Based Metal-Organic Framework Membranes and Their Field-Effect Transistor Sensors for Mercury Detection · Shen S., Tan P., Tang Y. et al. · ACS Applied Electronic Materials · 2022 · 622-630

2 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

XRD, FT-IR and SEM after GA/DNA modification

Infrared spectroscopyX-ray diffraction and scatteringScanning electron microscopy

S4-based Ni3(HITP)2-GA-DNA FET sensor · Electrode

Structural and morphology checks of the S4-based Ni3(HITP)2-GA-DNA sensor after GA and DNA probe modification.

Geometry
S4 Ni3(HITP)2 membrane FET sensor
Context
GA-DNA-functionalised S4 membrane sensor
Measurement source
627 · 3.2. Hg2+ Sensing Performance · Figures S7 and S8
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
GA-DNA sensor retained phase and morphologyalmost the same morphology and phase structure as pristine Ni3(HITP)2 before modification——Text
Qualitative		627 · 3.2. Hg2+ Sensing Performance · Figures S7 and S8

PXRD and FT-IR

Infrared spectroscopyX-ray diffraction and scattering

S4 Ni3(HITP)2 membrane · Thin Film

PXRD and FT-IR analysis of S1-S4 samples; result row captures common phase/peak assignment for the Ni3(HITP)2 membrane series.

Context
pristine Ni3(HITP)2 membrane series
Measurement source
625-626 · 3.1. Structural and Morphological Characteristics · Figure 5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
FT-IR benzene skeleton band1630 cm-1——Text
Rounded Reported		626 · 3.1. Structural and Morphological Characteristics · Figure 5b
FT-IR secondary amine NH band3420 cm-1——Text
Rounded Reported		626 · 3.1. Structural and Morphological Characteristics · Figure 5b
PXRD (001) reflection27.5 degrees 2theta——Text
Rounded Reported		626 · 3.1. Structural and Morphological Characteristics · Figure 5a
PXRD (100) reflection4.7 degrees 2theta——Text
Rounded Reported		626 · 3.1. Structural and Morphological Characteristics · Figure 5a
PXRD additional reflection12.6 degrees 2theta——Text
Rounded Reported		626 · 3.1. Structural and Morphological Characteristics · Figure 5a
PXRD (200) reflection9.5 degrees 2theta——Text
Rounded Reported		626 · 3.1. Structural and Morphological Characteristics · Figure 5a
PXRD phase purityS1-S4 samples have pure Ni3(HITP)2 structure without other impurities——Text
Qualitative		626 · 3.1. Structural and Morphological Characteristics · Figure 5a