Microscopy Morphology — Adjustable Synthesis of Ni-Based Metal-Organic Framework Membranes and Their Field-Effect Transistor Sensors for Mercury Detection

7 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

S1 Ni3(HITP)2 membrane · Thin Film

AFM step-height thickness of S1 membrane.

Geometry: thin film on device/channel substrate
Context: pristine Ni3(HITP)2 membrane
Measurement source: 626 · 3.1. Structural and Morphological Characteristics · Figure 4a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S1 membrane thickness	24.1 nm	—	—	Text Rounded Reported	626 · 3.1. Structural and Morphological Characteristics · Figure 4a

S2 Ni3(HITP)2 membrane · Thin Film

AFM step-height thickness of S2 membrane.

Geometry: thin film on device/channel substrate
Context: pristine Ni3(HITP)2 membrane
Measurement source: 626 · 3.1. Structural and Morphological Characteristics · Figure 4b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S2 membrane thickness	60.5 nm	—	—	Text Rounded Reported	626 · 3.1. Structural and Morphological Characteristics · Figure 4b

S3 Ni3(HITP)2 membrane · Thin Film

AFM step-height thickness of S3 membrane.

Geometry: thin film on device/channel substrate
Context: pristine Ni3(HITP)2 membrane
Measurement source: 626 · 3.1. Structural and Morphological Characteristics · Figure 4c

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S3 membrane thickness	88.3 nm	—	—	Text Rounded Reported	626 · 3.1. Structural and Morphological Characteristics · Figure 4c

S4 Ni3(HITP)2 membrane · Thin Film

AFM step-height thickness of S4 membrane.

Geometry: thin film on device/channel substrate
Context: pristine Ni3(HITP)2 membrane
Measurement source: 626 · 3.1. Structural and Morphological Characteristics · Figure 4d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S4 membrane thicknessMarked as a best value within this paper	114.7 nm	—	—	Text Rounded Reported	626 · 3.1. Structural and Morphological Characteristics · Figure 4d

S1 Ni3(HITP)2 membrane · Thin Film

SEM morphology of S1 membrane on the channel; instrument stated as SU8020 FESEM at 5 kV.

Geometry: Si/SiO2/Au FET channel
Context: pristine Ni3(HITP)2 membrane
Measurement source: 624 · 3.1. Structural and Morphological Characteristics · Figure 2a,e

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S1 morphology	small amount of flake aggregates distributed in the channel	—	—	Text Qualitative	625 · 3.1. Structural and Morphological Characteristics · Figure 2a

S4 Ni3(HITP)2 membrane · Thin Film

SEM morphology of optimised S4 membrane on the channel.

Geometry: Si/SiO2/Au FET channel
Context: pristine Ni3(HITP)2 membrane
Measurement source: 626 · 3.1. Structural and Morphological Characteristics · Figure 2d,h

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S4 morphologyMarked as a best value within this paper	very uniform and dense; thin and tightly stacked nanosheet structures	—	—	Text Qualitative	626 · 3.1. Structural and Morphological Characteristics · Figure 2d,h

S4 Ni3(HITP)2 membrane · Thin Film

Nanostructure/crystallinity and elemental distribution of S4 sample.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S4 HRTEM crystallinity	distinct lattice fringes and distinguishable diffraction rings; homogeneous Ni, N and C elemental distribution	—	—	Text Qualitative	626 · 3.1. Structural and Morphological Characteristics · Figure 3