Diffraction Structure — Enhancing Near-Infrared Photothermal Performance by Molecular Aggregation Optimization in Semiconductive Coordination Polymers

Measurement evidence

Diffraction Structure

Enhancing Near-Infrared Photothermal Performance by Molecular Aggregation Optimization in Semiconductive Coordination Polymers · Yan Y., Li Z.-Y., Qu K.-G. et al. · Inorganic Chemistry · 2024 · 22502-22511

4 measurement groups · 14 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction on SmartLab 9 kW diffractometer using Cu Kalpha radiation

compound 1 pure bulk product from CdCl2 variant · Powder

PXRD used to verify pure compound 1 product from CdCl2 variant.

Temperature
room temperature
Geometry
powder
Context
pristine framework
Measurement source
22503 · 2.1.1; 2.1 Materials · Figure S21a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD purity checkproduct was pure verified by PXRD——Text
Qualitative
22503 · 2.1.1 · Figure S21a

Powder X-ray diffraction on SmartLab 9 kW diffractometer using Cu Kalpha radiation

compound 2 pure microcrystalline product · Powder

PXRD comparison of as-synthesised and simulated compound 2 patterns.

Temperature
room temperature
Geometry
powder
Context
pristine framework
Measurement source
S12 · Figure section · Figure S21
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Single-crystal X-ray diffraction on Bruker SMART diffractometer; Mo Kalpha radiation; SHELX/Olex2 refinement

compound 1 brown plate crystals · Single Crystal

Structure solved by direct methods; ligand H atoms added geometrically and treated with riding model.

Temperature
293(2)
Geometry
single crystal
Context
pristine framework
Measurement source
22503 · 2.2 X-ray Crystallography · Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CCDC deposition number2373613——SI Table
Exact Reported
S2 · Table section · Table S1
short pi-pi distance maximum3.30(2) to 3.43(2) A—(2)Text
Range
22504 · 3.1 Crystal Structure · Figure 1c
short pi-pi distance minimum3.30(2) to 3.43(2) A—(2)Text
Range
22504 · 3.1 Crystal Structure · Figure 1c
slip angle56.8(1) deg—(1)Text
Exact Reported
22504 · 3.1 Crystal Structure · Figure S2a
space groupC2/m——SI Table
Exact Reported
S2 · Table section · Table S1
unit cell volume771(3)—(3)SI Table
Exact Reported
S2 · Table section · Table S1

Single-crystal X-ray diffraction on Bruker SMART diffractometer; radiation wavelength listed in SI; SHELX/Olex2 refinement

compound 2 brown single crystals · Single Crystal

Structure solved by direct methods; ligand H atoms added geometrically and treated with riding model.

Temperature
180
Geometry
single crystal
Context
pristine framework
Measurement source
S2 · Table section · Table S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CCDC deposition number2373614——SI Table
Exact Reported
S2 · Table section · Table S1
dihedral angle between adjacent naphthalene planes1.9(2) deg—(2)Text
Exact Reported
22505 · 3.1 Crystal Structure · Figure S6
centroid-centroid pi-pi distance maximum3.537 to 3.650 A——Text
Range
22504 · 3.1 Crystal Structure · Figure 1f
centroid-centroid pi-pi distance minimum3.537 to 3.650 A——Text
Range
22504 · 3.1 Crystal Structure · Figure 1f
rotation angle between long molecular axes49.70(7) deg—(7)Text
Exact Reported
22504 · 3.1 Crystal Structure · Figure S2b
space groupC2/c——SI Table
Exact Reported
S2 · Table section · Table S1
unit cell volume1305.93(19)—(19)SI Table
Exact Reported
S2 · Table section · Table S1