Diffraction Structure — Self-assembly and optoelectronic properties of isoreticular MOF nanocrystals

Measurement evidence

Diffraction Structure

Self-assembly and optoelectronic properties of isoreticular MOF nanocrystals · Dawood S., Yarbrough R., Davis K. et al. · Synthetic Metals · 2019 · 107-112

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder XRD/WAXS with Cu Ka radiation and SAED by TEM dark-field diffraction mode

X-ray diffraction and scattering Transmission electron microscopy

off-white crystalline IRMOF-8 microstructure powder · Powder

Powder XRD at 40 kV, 40 mA, lambda = 1.540 A, 60 s speed; SAED along [001] axis.

Context: pristine framework powder
Measurement source: 109 · 3.1. Synthesis and characterization · Fig. 2 and Fig. 3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
SAED viewing axis	[001] axis	—	—	Text Qualitative	110 · 3.1. Synthesis and characterization · Fig. 3(b)
topology assignment	primitive cubic (pcu) lattice topology; two-fold interpenetrated analogue	—	—	Text Qualitative	109 · 3.1. Synthesis and characterization · Fig. 3(a,b)
strongest experimental low-angle XRD peak	approximately 6.0 degrees 2-theta from Fig. 2(a)	6 degree 2-theta	visual estimate from plot axis	Figure Axis Approximate	110 · Figure 2 · Fig. 2(a)
XRD phase assignment	experimental diffraction pattern overlaps simulated INT-IRMOF-8 A	—	—	Qualitative Qualitative	109 · 3.1. Synthesis and characterization · Fig. 2(a)