Porosity — Self-assembly and optoelectronic properties of isoreticular MOF nanocrystals

Measurement evidence

Porosity

Self-assembly and optoelectronic properties of isoreticular MOF nanocrystals · Dawood S., Yarbrough R., Davis K. et al. · Synthetic Metals · 2019 · 107-112

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM/TEM image-inferred surface porosity

as-prepared IRMOF-8 microstructures in DMF · Powder

Randomly patterned surface porosity and voids observed in as-prepared DMF microstructures.

Context
pristine framework morphology sample
Measurement source
110 · 3.2. Solvents dependent self-assembly and their morphology studies · Fig. 4(a,b)
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
image-inferred pore dimension upper bound2-19 nm19 nmText
Range
110 · 3.2. Solvents dependent self-assembly and their morphology studies · Fig. 4(a,b)
image-inferred pore dimension lower bound2-19 nm2 nmText
Range
110 · 3.2. Solvents dependent self-assembly and their morphology studies · Fig. 4(a,b)