Out-of-plane X-ray diffraction
BPA@Cu(BDC)-SURMOF-2 after electropolymerisation · Electrode
D8-Advance Bruker AXS diffractometer, Cu K-alpha radiation, theta-theta geometry, position sensitive detector, variable divergence slit.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Approximate Cu(BDC) SURMOF (100) XRD peak | about 8.3 degrees 2 theta | — | visual estimate from plot axis | Figure Axis Approximate | main p.3 · Results and Discussion · Figure 2b |
| Approximate Cu(BDC) SURMOF (200) XRD peak | about 16.7 degrees 2 theta | — | visual estimate from plot axis | Figure Axis Approximate | main p.3 · Results and Discussion · Figure 2b |
| Approximate Cu(BDC) SURMOF (300) XRD peak | about 24.8 degrees 2 theta | — | visual estimate from plot axis | Figure Axis Approximate | main p.3 · Results and Discussion · Figure 2b |
| XRD peak positions after EP | No further changes in diffraction peak positions; intensities slightly reduced | — | — | Text Qualitative | main p.4 · Results and Discussion · Figure 2b |
| XRD after 1-hexyne immersion | No major differences to pristine film | — | — | Text Qualitative | main p.3 · Results and Discussion · Figure S2 |