FIB-SEM cross-section and EDX mapping
BPA@Cu(BDC)-SURMOF-2 after electropolymerisation · Electrode
FIB trenches using FEI Strata 400 with 300 nm Pt protection layer; SEM cross-section at 5 kV; EDX at 5 kV with Oxford Instruments X-MaxN 50 mm2 detector in Gemini LEO 1530 SEM.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Gold electrode film thickness | 90 +/- 5 nm | — | +/- 5 nm | Text Exact Reported | main p.4 · Results and Discussion · Figure S4 |
| MOF layer thickness from SEM/FIB cross-section | 100 +/- 5 nm | — | +/- 5 nm | Text Exact Reported | SI p.S-3 · SEM-EDX Analytical equipment · Figure S4 |