X-ray photoelectron spectroscopy (XPS)
CM nanosheets · Nanosheet
XPS survey and high-resolution Cu 2p, N 1s, O and C spectra used to confirm composition and Cu-N bonding.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CM C 1s dominant envelope peak | about 284.8 eV | — | visual estimate from high-resolution spectrum | Figure Axis Approximate | S12 · Supplementary figures · Fig. S6b |
| CM Cu 2p characteristic peak | 933.81 eV | — | — | Text Exact Reported | p003 · 2.1 Synthesis and characterization · Fig. 1h |
| CM N 1s Cu-N bonding peak | 402.87 eV | — | — | Text Exact Reported | p003 · 2.1 Synthesis and characterization · Fig. 1i |
| CM O 1s dominant envelope peak | about 532 eV | — | visual estimate from high-resolution spectrum | Figure Axis Approximate | S12 · Supplementary figures · Fig. S6c |