Out-of-plane X-ray diffraction/GIXRD and powder XRD
PcM-Cu-nC MOF film series (M = Ni, Cu, H2; n = 10-40 cycles) · Thin Film
PcM-Cu-30C films on glass and PcM-Cu powders.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PcM-Cu-30C film crystallinity | weak-crystalline framework | — | — | Qualitative Qualitative | 210 · Morphology and structural characterization · Supporting Information Figure S6 |