Spectroscopy — Two-Dimensional Conductive Metal-Organic Framework Reinforced Spinterface in Organic Spin Valves

Measurement evidence

Spectroscopy

Two-Dimensional Conductive Metal-Organic Framework Reinforced Spinterface in Organic Spin Valves · Song X., Jin C., Chen H. et al. · CCS Chemistry · 2023 · 208-217

6 measurement groups · 13 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

UV-vis absorption, UPS, and derived LUMO calculations

PcCu-Cu-30C MOF film · Thin Film

PcCu-Cu film; UV-vis/UPS electronic-structure measurement and derived LUMO.

Temperature
300
Geometry
Thin films
Context
Pristine PcM-Cu MOF film controls.
Measurement source
211 · Electronic structure and charge transport properties · Figures S12-S14
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Optical bandgap of PcCu-Cu film1.22 eVText
Exact Reported
211 · Electronic structure and charge transport properties · Supporting Information Figure S12
HOMO level of PcCu-Cu film-5.27 eVText
Exact Reported
S13 · Figure S13 · Figure S13
LUMO level of PcCu-Cu film-4.05 eVCalculated From Reported
Exact Reported
S13 · Figure S14 · Figure S14

UV-vis absorption, UPS, and derived LUMO calculations

PcH2-Cu-30C MOF film · Thin Film

PcH2-Cu film; UV-vis/UPS electronic-structure measurement and derived LUMO.

Temperature
300
Geometry
Thin films
Context
Pristine PcM-Cu MOF film controls.
Measurement source
211 · Electronic structure and charge transport properties · Figures S12-S14
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Optical bandgap of PcH2-Cu filmMarked as a best value within this paper1.00 eVText
Exact Reported
211 · Electronic structure and charge transport properties · Supporting Information Figure S12
HOMO level of PcH2-Cu film-5.21 eVText
Exact Reported
S13 · Figure S13 · Figure S13
LUMO level of PcH2-Cu film-4.21 eVCalculated From Reported
Exact Reported
S13 · Figure S14 · Figure S14

UV-vis absorption, UPS, and derived LUMO calculations

PcNi-Cu-30C MOF film · Thin Film

PcNi-Cu film; UV-vis/UPS electronic-structure measurement and derived LUMO.

Temperature
300
Geometry
Thin films
Context
Pristine PcM-Cu MOF film controls.
Measurement source
211 · Electronic structure and charge transport properties · Figures S12-S14
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Optical bandgap of PcNi-Cu film1.20 eVText
Exact Reported
211 · Electronic structure and charge transport properties · Supporting Information Figure S12
HOMO level of PcNi-Cu film-5.18 eVText
Exact Reported
211 · Electronic structure and charge transport properties · Supporting Information Figure S13
LUMO level of PcNi-Cu film-3.98 eVCalculated From Reported
Exact Reported
S13 · Figure S14 · Figure S14

UV-vis absorption, UPS, and derived LUMO calculations

PcM-Cu-nC MOF film series (M = Ni, Cu, H2; n = 10-40 cycles) · Thin Film

Electronic structure of PcM-Cu films; UPS acquired at 300 K in SI.

Temperature
300
Geometry
Thin films
Context
Pristine PcM-Cu MOF film controls.
Measurement source
211 · Electronic structure and charge transport properties · Figures S12-S14
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

UV-vis absorption spectroscopy

PcM-Cu-nC MOF film series (M = Ni, Cu, H2; n = 10-40 cycles) · Thin Film

PcM-Cu films with different cycle numbers.

Geometry
Film on substrate
Context
Pristine PcM-Cu MOF film controls.
Measurement source
210-211 · Morphology and structural characterization · Figure 2a,d,g
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Absorbance growth marker~307 nm absorbance increased with growth cycles~Text
Approximate
210-211 · Morphology and structural characterization · Figure 2a,d,g

X-ray photoelectron spectroscopy

PcM-Cu-nC MOF film series (M = Ni, Cu, H2; n = 10-40 cycles) · Thin Film

Survey and high-resolution spectra of PcM-Cu-30C films.

Geometry
Thin film
Context
Pristine PcM-Cu MOF film controls.
Measurement source
210-211 · Morphology and structural characterization · Figure 2b,e,h; Figure S10
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PcCu-Cu-30C and PcH2-Cu-30C XPS survey elementsC, N, O, and Cu onlyText
Qualitative
210 · Morphology and structural characterization · Figure 2e,h
PcNi-Cu-30C XPS survey elementsC, N, O, Cu, and Ni onlyText
Qualitative
210 · Morphology and structural characterization · Figure 2b
High-resolution Cu 2p3/2 prominent peak~935 eV~Text
Approximate
210 · Morphology and structural characterization · Supporting Information Figure S10a,c