Microscopy Morphology — Two-Dimensional Conductive Metal-Organic Framework Reinforced Spinterface in Organic Spin Valves

3 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

STO/LSMO/PcNi-Cu-30C/Co/Au organic spin valve · Electrode

STO/LSMO/PcNi-Cu MOF/Co/Au OSV cross-section.

Geometry: Layered vertical OSV
Context: Composite OSV interface analysis.
Measurement source: 213-214 · Results and Discussion · Figure 5a-c; Figure S28

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Co penetration relative to MOF layer thickness	diffusion length was smaller than the MOF layer thickness	—	—	Qualitative Qualitative	214 · Results and Discussion · Figure 5a-c; Figure S28
Au layer thickness in cross-section device	~150 nm	—	~	Caption Approximate	214 · Figure caption · Figure 5a
Co layer thickness in cross-section device	~30 nm	—	~	Caption Approximate	214 · Figure caption · Figure 5a
LSMO layer thickness in cross-section device	~45 nm	—	~	Caption Approximate	214 · Figure caption · Figure 5a
PcNi-Cu MOF layer thickness in cross-section device	~40 nm	—	~	Caption Approximate	214 · Figure caption · Figure 5a

PcM-Cu-nC MOF film series (M = Ni, Cu, H2; n = 10-40 cycles) · Thin Film

Films with different LBL growth cycles on glass and other hydroxylated substrates.

Geometry: Thin film on substrate
Context: Pristine PcM-Cu MOF film controls.
Measurement source: 210 · Morphology and structural characterization · Supporting Information Figures S2-S5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PcCu-Cu film average growth rate	3.1 nm per cycle	—	—	Text Exact Reported	210 · Morphology and structural characterization · Supporting Information Figure S5a
PcH2-Cu film average growth rateMarked as a best value within this paper	3.7 nm per cycle	—	—	Text Exact Reported	210 · Morphology and structural characterization · Supporting Information Figure S5a
PcNi-Cu film average growth rate	2.6 nm per cycle	—	—	Text Exact Reported	210 · Morphology and structural characterization · Supporting Information Figure S5a
Maximum RMS roughness of PcM-Cu-40C films	<= 10 nm	—	upper bound	Text Range	210 · Morphology and structural characterization · Supporting Information Figure S5b

PcM-Cu MOF powder series (M = Ni, Cu, H2) · Powder

PcM-Cu-MOF bulk crystallites; high-resolution film TEM not obtained due to low crystallinity/electron-beam damage.

Geometry: Bulk crystallites
Context: Pristine PcM-Cu MOF powders.
Measurement source: 210 · Morphology and structural characterization · Supporting Information Figure S7

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Square micropore size in bulk crystallites	~1.7 nm	—	~	Text Approximate	210 · Morphology and structural characterization · Supporting Information Figure S7