SEM/EDX, Raman and PXRD
Cu-BHT-w NH3-assisted CVD thin film · Thin Film
Cu-BHT-w structural/morphological confirmation and PXRD comparison with Cu-BHT-o.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| S-H Raman peak absence | S-H peak at ~2500 cm^-1 absent | — | — | Caption Qualitative | SI p31 · Figure S25 caption · Figure S25c |