AFM topography
Fe-HHB-w NH3-assisted CVD thin film · Thin Film
AFM thickness and roughness measurements for Fe-HHB-w thin films grown for 10 min to 6 h.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| surface roughness Rq for 633 nm film | ~8 nm | — | — | Text Approximate | SI p12 · Figure S6 discussion · Figure S6 |
| film thickness after 0.5 h growth | ~72.2 nm | — | — | Caption Approximate | SI p11 · Figure S5 caption · Figure S5d |
| film thickness after 10 min growth | ~11.5 nm | — | — | Caption Approximate | 18191 · Results and Discussion · Figure 2f |
| film thickness after 1 h growth | ~150.8 nm | — | — | Caption Approximate | SI p11 · Figure S5 caption · Figure S5e |
| film thickness after 6 h growth | ~633.2 nm | — | — | Caption Approximate | SI p11 · Figure S5 caption · Figure S5f |