X-ray diffraction (XRD)
CuHITP/Cu(OH)2 extended-gate electrode · Electrode
Converted CuHITP/Cu(OH)2 nanoarray compared with Cu(OH)2 template and solvothermal CuHITP powder.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CuHITP XRD peaks in converted film | 4.6, 9.8, and 27.6 degrees 2theta | — | — | Text Exact Reported | 4 · 2.1 Material Characterization · Figure 2c |
| Cu(OH)2 diagnostic XRD peaks in converted film | 16.8, 24.0, 33.1, 38.3, 51.0 degrees 2theta | — | — | Text Exact Reported | 4 · 2.1 Material Characterization · Figure 2c |
| dominant Si substrate peak for Cu(OH)2 nanoarray | about 69.1 degrees 2theta | — | about | Text Approximate | 4 · 2.1 Material Characterization · Figure S4 cited |