| Complex 1 light-yellow X-ray-quality crystalsresearch_0594__mat__cp1 | Single Crystal · Target Sample · Pristine Framework | Slow-evaporated acetonitrile crystals; also used as bulk material for PXRD, TGA, optical and sensing measurements. | 4540 · Preparation of (1) |
| Complex 2 light-yellow X-ray-quality crystalsresearch_0594__mat__cp2 | Single Crystal · Target Sample · Pristine Framework | Slow-evaporated acetonitrile crystals; also used as bulk material for PXRD, TGA, optical and sensing measurements. | 4540 · Preparation of (2) |
| Complex 3 light-yellow X-ray-quality crystalsresearch_0594__mat__cp3 | Single Crystal · Target Sample · Pristine Framework | Slow-evaporated acetonitrile crystals; also used as bulk material for PXRD, TGA, optical and sensing measurements. | 4540 · Preparation of (3) |
| Complex 4 light-yellow crystalsresearch_0594__mat__cp4 | Single Crystal · Target Sample · Pristine Framework | Slow-evaporated acetonitrile crystals; also used as bulk material for PXRD, TGA, optical and sensing measurements. | 4540 · Preparation of (4) |
| CSD1 thin-film Schottky device from CP1research_0594__mat__cp1 | Thin Film · Target Sample · Pristine Framework | DMF dispersion spin-coated, dried at 80 deg C in vacuum, Al deposited in vacuum.ITO-coated glass with Al top electrode · ~1 um film used in dielectric calculation; Al electrode diameter 1.5 cm; ITO glass 2 cm x 2 cm | S20-S24 · Device Fabrication; Electrical Characterization · Figures S31-S33 |
| CSD2 thin-film Schottky device from CP2research_0594__mat__cp2 | Thin Film · Target Sample · Pristine Framework | DMF dispersion spin-coated, dried at 80 deg C in vacuum, Al deposited in vacuum.ITO-coated glass with Al top electrode · ~1 um film used in dielectric calculation; Al electrode diameter 1.5 cm; ITO glass 2 cm x 2 cm | S20-S24 · Device Fabrication; Electrical Characterization · Figures S31-S33 |
| CSD3 thin-film Schottky device from CP3research_0594__mat__cp3 | Thin Film · Target Sample · Pristine Framework | DMF dispersion spin-coated, dried at 80 deg C in vacuum, Al deposited in vacuum.ITO-coated glass with Al top electrode · ~1 um film used in dielectric calculation; Al electrode diameter 1.5 cm; ITO glass 2 cm x 2 cm | S20-S24 · Device Fabrication; Electrical Characterization · Figures S31-S33 |
| CSD4 thin-film Schottky device from CP4research_0594__mat__cp4 | Thin Film · Target Sample · Pristine Framework | DMF dispersion spin-coated, dried at 80 deg C in vacuum, Al deposited in vacuum.ITO-coated glass with Al top electrode · ~1 um film used in dielectric calculation; Al electrode diameter 1.5 cm; ITO glass 2 cm x 2 cm | S20-S24 · Device Fabrication; Electrical Characterization · Figures S31-S33 |
| Bare ITO controlresearch_0594__mat__ito_control | Electrode · Pristine Control · Model | Bare ITO measured under dark and light.ITO-coated glass | S22-S23 · Electrical Characterization · Figure S34; Table S3 |
| LSD1 ligand-only Schottky-device controlresearch_0594__mat__l1_control | Thin Film · Pristine Control · Model | Ligand L1 device control measured under dark and light.ITO-coated glass with Al top electrode | S20-S23 · Device Fabrication; Electrical Characterization · Figure S35; Table S3 |
| LSD2 ligand-only Schottky-device controlresearch_0594__mat__l2_control | Thin Film · Pristine Control · Model | Ligand L2 device control measured under dark and light.ITO-coated glass with Al top electrode | S20-S23 · Device Fabrication; Electrical Characterization · Figure S35; Table S3 |