AFM and FESEM
CSD1 thin-film Schottky device from CP1 · Thin Film
AFM images of device thin films; FESEM before and after sensing.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| FESEM morphology and post-sensing integrity | rod/block-like surface morphology; structural integrity retained after sensing | — | — | Text Qualitative | 4536 · Sensing · Figure S106 |