Diffraction Structure — Emergence of Metallic Conductivity in Ordered One-Dimensional Coordination Polymer Thin Films upon Reductive Doping

3 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

H2/He-reduced Cu-DMD film on interdigitated electrode array · Electrode

Heating stage in stainless-steel chamber with Kapton windows; 170 deg C for 130 min to 2 h under 5% H2/He

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GIWAXS d-value shift during H2 annealing	main peak shifts to slightly lower d-value, around 0.8 nm	—	around	Caption Approximate	p008 / SI p.7 · Supporting Information · Figure S12
No new crystalline phase during annealing	No new crystalline phases are formed during the annealing process	—	—	Text Qualitative	p005 / article p.10253 · Results and Discussion · Figure S12

Cu-DMD film on TiN-coated Si · Thin Film

Cu-DMD films deposited on TiN-coated and Pt-coated Si compared with native-oxide Si

Atmosphere: Air for ex situ samples
Context: Pristine Cu-DMD films on alternative substrates
Measurement source: p004 / article p.10252 · Results and Discussion · Figure S6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Substrate-dependent ordering	TiN-coated Si gives more spread scattering; Pt-coated substrate gives significantly weaker ordering	—	—	Text Qualitative	p004 / article p.10252 · Results and Discussion · Figure S6a,b; Figure S4e,f

As-deposited Cu-DMD thin film on Si(100) with native oxide · Thin Film

Ex situ GIWAXS at NCD-SWEET beamline; 12.4 keV, incident angle 0.15 deg; XRD compared with calculated pattern

Atmosphere: Air for ex situ GIWAXS
Context: As-deposited Cu-DMD thin film on Si native oxide
Measurement source: p003 / article p.10251 · Experimental Section · Figure 1c,d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Out-of-plane orientation	Bragg reflection intensity concentrated along qz axis, indicating strong out-of-plane orientation	—	—	Text Qualitative	p004 / article p.10252 · Results and Discussion · Figure 1d
Experimental Cu-DMD diffraction d-spacing	single prominent diffraction peak corresponding to d = 8.2 A	—	—	Text Rounded Reported	p003 / article p.10251 · Results and Discussion · Figure 1c