Microscopy Morphology — Emergence of Metallic Conductivity in Ordered One-Dimensional Coordination Polymer Thin Films upon Reductive Doping

Measurement evidence

Microscopy Morphology

Emergence of Metallic Conductivity in Ordered One-Dimensional Coordination Polymer Thin Films upon Reductive Doping · Nisula M., Karttunen A.J., Solano E. et al. · ACS Applied Materials and Interfaces · 2021 · 10249-10256

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Atomic force microscopy (AFM), tapping mode

Atomic force microscopy

As-deposited Cu-DMD thin film on Si(100) with native oxide · Thin Film

Bruker Dimension Edge AFM

Context: As-deposited, H2-treated, and Pt-substrate Cu-DMD films
Measurement source: p002 / article p.10250 · Experimental Section · Figure S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Bare Si RMS roughness comparator	0.1 nm RMS roughness	—	—	Text Exact Reported	p003 / article p.10251 · Results and Discussion
As-deposited film RMS roughness	0.27 nm RMS roughness	—	—	Text Exact Reported	p003 / article p.10251 · Results and Discussion · Figure S4a,b