Diffraction Structure — Oriented Growth of In-Oxo Chain Based Metal-Porphyrin Framework Thin Film for High-Sensitive Photodetector

Measurement evidence

Diffraction Structure

Oriented Growth of In-Oxo Chain Based Metal-Porphyrin Framework Thin Film for High-Sensitive Photodetector · Tian Y.-B., Vankova N., Weidler P. et al. · Advanced Science · 2021 · 2100548

1 measurement group · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

X-ray diffraction, out-of-plane and in-plane XRD

In-TCPP SURMOF, 15 LPE cycles · Thin Film

Cu-Kalpha radiation; 2theta range 5-30 deg reported in SI instrumentation.

Geometry
thin film on substrate
Context
pristine oriented SURMOF
Measurement source
3 · Results and Discussion · Figure 1a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
porphyrinic interlamellar distanceMarked as a best value within this paper7.1 ASI Table
Rounded Reported
23 · Results and Discussion · Table S1
in-plane XRD peaks5.2, 7.5, 11.7, and 15.0 deg 2theta assigned to (001), (021), (022), and (042)Text
Rounded Reported
3 · Results and Discussion · Figure 1a
out-of-plane XRD peak assigned to (021)7.5 deg 2thetaText
Rounded Reported
3 · Results and Discussion · Figure 1a
out-of-plane XRD peak assigned to (042)15.0 deg 2thetaText
Rounded Reported
3 · Results and Discussion · Figure 1a
out-of-plane XRD peak assigned to (063)22.5 deg 2thetaText
Rounded Reported
3 · Results and Discussion · Figure 1a